Eu- and Li-doped yttrium oxide nanocrystals [Y2-xO3; Eux, Liy], in which Eu and Li dopant ion concentrations were systematically varied, were developed and characterized (TEM, XRD, Raman spectroscopic, UV-excited lifetime, and ICP-AES data) in order to define the most emissive compositions under specific X-ray excitation conditions. These optimized [Y2-xO3; Eux, Liy] compositions display scinti...

Piezoelectric membranes consisting of sputter deposited PbZrxTi1−xO3 (PZT) films on silicon diaphragms have been investigated for their resonance and piezoelectrical properties, in view of their application as stator of a micromotor. The behavior of resonance frequencies was studied as a function of membrane thickness and dc-bias, in order to derive the total stress in the films and the piezoel...

In this study we developed LaNixAl1-xO3 perovskite systems using a sol-gelmethod (with propionic acid as solvent) to use in methane-reforming reactions for producing synthesis gas. To understand the roles of the nature of the precursor and calcination conditions on the formation of LaNixAl1-xO3, we carried out identifications using NMR, FT-IR, XRD, SEM, and TEM. The precursor struc...

This paper reviews deposition, integration, and device fabrication of ferroelectric PbZrxTi1−xO3 (PZT) films for applications in microelectromechanical systems. As examples, a piezoelectric ultrasonic micromotor and pyroelectric infrared detector array are presented. A summary of the published data on the piezoelectric properties of PZT thin films is given. The figures of merit for various appl...

Polycrystalline samples of Lead free (K0.5Na0.5)1−x(Li)x(Sb)x(Nb)1−xO3 ceramics with nominal compositions (x = 0.040 to 0.060) have been prepared by high temperature solid state reaction technique. X-ray diffraction (XRD) pattern shows that the crystal structure transforms from orthorhombic to tetragonal as Li and Sb content increases. Normal sintering process yield compounds with density ~98.2...

In this study, the microstructure of multilayer PbTixZr1-xO3 (PZT) specimens processed at temperatures from 1175 C – 1325 C was examined by scanning electron microscopy (SEM) and X-ray diffraction (XRD) line broadening analysis. Observed grain sizes were 2.5 m – 4_ m; coherently diffracting domain sizes were 20 nm – 80 nm. A reorientation of cand adomains as a result of electrical poling and fa...

In this work, SrO buffer layers were employed as an interface engineering approach to realize single crystalline mixed ternary rare earth bixbyite oxide (RE2O3) films on Si (001) substrate. Single crystalline mixed PrxY2-xO3 (x=0-2) has been successfully grown on Si (111) (Ref. 7). However, the formation of such mixed oxide can only be realized at >750 °C, therefore when it is directly grown on...