background : collection and storage of roof rain water have been practiced for long time ago in iran and many other countries. water of cisterns is usually used as potable water. in golestan province many of rural torkman residents reservoir the most part of their potable water from roof rain in cisterns. in this province there are over 2600 cisterns. methods : to study the water quality, micro...

This paper deals with the design and fabrication of a quartz-crystal resonator used in a thickness-monitor unit, measuring film thickness in a film-depositing system. A purpose-grown quartz crystal is cut to form the desired wafer. Two gold electrodes are deposited on both surfaces of the wafer to provide electrical contacts. The resonance frequency of the resonator, at room temperature, and th...

Porous silicon nanowires are synthesized through metal assisted wet-chemical etch of highly-doped silicon wafer. The resulted porous silicon nanowires exhibit a large surface area of 337 m(2)·g(-1) and a wide spectrum absorption across the entire ultraviolet, visible and near infrared regime. We further demonstrate that platinum nanoparticles can be loaded onto the surface of the porous silicon...

The wafer defects influence the yield of a wafer. The integrated circuits (IC) manufacturers usually use a Poisson distribution based c-chart to monitor the lot-to-lot wafer defects. As the wafer size increases, defects on wafer tend to cluster. When the c-chart is used, the clustered defects frequently cause erroneous results. The main objective of this study is to develop a hierarchical adapt...

Experimental measurements of wafer temperature in a single-wafer, lamp-heated chemical vapor deposition system were used to study the wafer temperature response to gas composition. A physically based simulation procedure for the process gas and wafer temperature was developed in which a subset of parameter values were estimated using a nonlinear, iterative parameter identification method, produ...

This paper demonstrates the viability of wafer-level methods as a means of evaluating device reliability using special reliability test structures and process control monitors (PCM). The results presented illustrate how this methodology can be employed to rapidly and effectively assess the impact of process or material changes on over-all reliability. The wafer-level methodology provides a quic...