نتایج جستجو برای: valgus dut

تعداد نتایج: 4195  

Journal: :The Journal of biological chemistry 1997
R D Ladner S J Caradonna

We have previously identified distinct nuclear and mitochondrial isoforms of dUTPase in human cells, reporting the cDNA sequence of the nuclear isoform (DUT-N). We now report a cDNA corresponding to the mitochondrial isoform (DUT-M). The DUT-M cDNA contains an 252-amino acid open reading frame, encoding a protein with a predicted Mr of 26,704. The amino-terminal region of the protein contains a...

2003
Jie Sun Mike Li

It is well known that the output signals measured by an automatic test equipment (ATE) system are not only due to the device-under-test (DUT), but also due to the test path. For example, if the intersymbol interference (ISI) due to the test path is not negligible, then the performance of the DUT can be grossly underestimated. In this paper, we propose a generic model for both the test path and ...

Journal: :Virus research 2007
Zhe Zhao Fei Ke Jianfang Gui Qiya Zhang

dUTPase (DUT) is a ubiquitous and important enzyme responsible for regulating levels of dUTP. Here, an iridovirus DUT was identified and characterized from Rana grylio virus (RGV) which is a pathogen agent in pig frog. The DUT encodes a protein of 164aa with a predicted molecular mass of 17.4 kDa, and its transcriptional initiation site was determined by 5'RACE to start from the nucleotide A at...

Journal: :Journal of virology 1999
A M Baldo M A McClure

dUTPase is a ubiquitous and essential enzyme responsible for regulating cellular levels of dUTP. The dut gene exists as single, tandemly duplicated, and tandemly triplicated copies. Crystallized single-copy dUTPases have been shown to assemble as homotrimers. dUTPase is encoded as an auxiliary gene in a number of virus genomes. The origin of viral dut genes has remained unresolved since their i...

2009

The schematic of the active bridge is shown in Appendix A. A photo of an assembled bridge is shown in Appendix B. The bridge contains two op amps. The input is buffered by the first op amp and sent to an output connector for the DUT. The reflection from the DUT returns to that connector where it is amplified by the second op amp. The DUT port presents a nice 50-ohm impedance to the DUT, which a...

Journal: :AIP Advances 2023

EPR measurements at X- (9.5 GHz), Q- (34 GHz) and W-band (94 on paddlewheel (PW) type post-synthetic metal exchanged DUT-49(M,M): M- Zn, Mn, Cu MOFs are here reported (DUT–Dresden University of Technology). Temperature-dependent X-band recorded from T = 7 K to 170 monometallic DUT-49(Cu), DUT-49(Mn), bimetallic DUT-49(Cu 0.7 Zn 0.3 ), 0.5 Mn ) MOFs. In the case II - dimers in an isotropic excha...

The causes of malalignment in total knee arthroplasty can be categorized into three different groups; 1) Errors in bone cuts 2) Errors in implant fixations, and 3) The method of setting down the cutting guides (1). We would like to announce that more several distal femoral valgus cut errors may occur during total knee replacement.

2002
Jan Verspecht Frans Verbeyst Marc Vanden Bossche

In this paper we present a new measurement solution for the characterization of high frequency devices under large signal operating conditions. It is shown how a device-under-test (DUT) is put under large signal operating conditions and how one then measures the voltage and current waveforms at the signal ports in order to completely and accurately characterize the DUT behavior.

2016
Daniel M. P. Ardisson-Araújo Rayane Nunes Lima Fernando L. Melo Rollie J. Clem Ning Huang Sônia Nair Báo Daniel R. Sosa-Gómez Bergmann M. Ribeiro

The genome of a novel group II alphabaculovirus, Perigonia lusca single nucleopolyhedrovirus (PeluSNPV), was sequenced and shown to contain 132,831 bp with 145 putative ORFs (open reading frames) of at least 50 amino acids. An interesting feature of this novel genome was the presence of a putative nucleotide metabolism enzyme-encoding gene (pelu112). The pelu112 gene was predicted to encode a f...

2002
Carlo Dallavalle

The combination of deep sub-micron technologies together with System on Chip complexity has brought the Device Under Test (DUT) Quiescent Supply Current (IDDQ ) into the Milliamps (mA) range. This IDDQ level, modulated by Electrical Parameters and Critical Dimensions Process spreads , makes almost impossible to detect the small current increase caused by the presence of a defect into the DUT. T...

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