magnetic force microscope ( mfm ) is a powerful technique for mapping the magnetic force gradient above the sample surface. herein, single-wall carbon nanotubes (swcnt) were used to fabricate mfm probe by dielectrophoresis method which is a reproducible and cost-effective technique. the effect of induced voltage on the deposition manner of carbon nanotubes (cnt) on the atomic force microscope (...

Magnetic force microscope ( MFM ) is a powerful technique for mapping the magnetic force gradient above the sample surface. Herein, single-wall carbon nanotubes (SWCNT) were used to fabricate MFM probe by dielectrophoresis method which is a reproducible and cost-effective technique. The effect of induced voltage on the deposition manner of carbon nanotubes (CNT) on the atomic force microscope (...

The emerging technique of magnetic resonance force microscopy (MRFM) (Sidles, 1991) was conceived by Sidles (1992) as a tool that could provide the revolutionary capability for three-dimensional imaging of single-copy biomolecules. This challenging goal has been augmented by a growing interest in applying it to imaging, especially subsurface imaging, of a broad range of materials and devices in...

A magnetic force microscope �MFM� was used to image topography and magnetic forces from a chain of submicron single magnetic domain particles produced by and contained in isolated magnetotactic bacteria. The noncontact magnetic force microscope data were used to determine a value for the magnetic moment of an individual bacterial cell, of order 10 emu, consistent with the average magnetic momen...

A commercial atomic force microscope/magnetic force microscope ~MFM! was modified to cool magnetic samples down to around 100 K under a high vacuum while maintaining its routine imaging functionality. MFM images of a 120 nm thick La0.7Ca0.3MnO3 film on a LaAlO3 substrate at low temperature show the paramagnetic-to-ferromagnetic phase transition. Evolution of magnetic domains and magnetic ripple...

We describe the design of a wide temperature range (300 mK-300 K) atomic force microscope/magnetic force microscope with a self-aligned fibre-cantilever mechanism. An alignment chip with alignment groves and a special mechanical design are used to eliminate tedious and time consuming fibre-cantilever alignment procedure for the entire temperature range. A low noise, Michelson fibre interferomet...

We have developed the variable temperature scanning force microscope capable of performing both magnetic resonance force microscopy (MRFM) and magnetic force microscopy (MFM) measurements in the temperature range between 5 and 300 K. Modular design, large scanning area, and interferometric detection of the cantilever deflection make it a sensitive, easy to operate, and reliable instrument suita...