نتایج جستجو برای: film thickness
تعداد نتایج: 191087 فیلتر نتایج به سال:
copper sulphide (cu 2 s) thin films at different thicknesses and annealing temperatures were deposited onto glass substrate by vacuum evaporation method. xrd study reveals the phase transformation of cu 2 s film at higher thickness. optical and resistivity study show the phase transformation of the film from cu 2 s to cus when they are annealed at higher temperature. sem st...
thin film phthalocyanines(pc), incloding zinc, iron, and magnesium phthalocyani-nes, were prepared by vacuum deposition method. chronocoulometry was used to study the charge transfer reaction mechanism of ionic species through the thin films. the results obtained in chronocoulometric studies shows that the thin film phthalocyanines could operate via two mechanisms.the first mechanism metal pc t...
copper thin films with nano-scale structure have numerous applications in modern technology. in this work, cu thin films with different thicknesses from 50–220 nm have been deposited on glass substrate by dc magnetron sputtering technique at room temperature in pure ar gas. the sputtering time was considered in 4, 8, 12 and 16 min, respectively. the thickness effect on the structural, morpholo...
in this research, tellurium (te) film with thicknesses of 100-250 nm were deposited on ceramic substrates by thermal evaporation at 373 k. the thickness of the film was determined by rutherford backscattering spectroscopy. the influence of the thickness on the structural, morphological and molecular bonds was characterized using xrd, scanning electron microscope, and raman spectroscopy. the xrd...
In this research, tellurium (Te) film with thicknesses of 100-250 nm were deposited on ceramic substrates by thermal evaporation at 373 K. The thickness of the film was determined by Rutherford backscattering spectroscopy. The influence of the thickness on the structural, morphological and molecular bonds was characterized using XRD, scanning electron microscope, and Raman spectroscopy. The XRD...
comparison of microleakage and thickness of resin cement in ceramic inlays with various temperatures
background and aims. microleakage is still one of the major problems of composite-based restorations. this study compared the microleakage and thickness of resin cement in ceramic inlays with various temperatures. materials and methods. class v cavities were prepared on the buccal and lingual aspects of thirty human molars with occlusal margins in enamel and gingival margins in dentin (3 mm wid...
This paper reports the correlation between film thickness, nanostructure and DC electrical properties of copper thin films deposited by PVD method on glass substrate. X-ray diffraction (XRD) and atomic force microscopy (AFM) were used for crystallography and morphology investigation, respectively. Resistivity was measured by four point probe instrument, while a Hall effects measurement system w...
This paper reports the correlation between film thickness, nanostructure and DC electrical properties of copper thin films deposited by PVD method on glass substrate. X-ray diffraction (XRD) and atomic force microscopy (AFM) were used for crystallography and morphology investigation, respectively. Resistivity was measured by four point probe instrument, while a Hall effects measurement system w...
struggling in world's competitive markets, industries are attempting to upgrade their technologies aiming at improving the quality and minimizing the waste and cutting the price. industry tries to develop their technology in order to improve quality via proactive quality control. this paper studies the possible paint quality in order to reduce the defects through neural network techniques in au...
Abstract: Different thickness of Cu2S thin films were prepared by vacuum evaporation under a pressure of 10-6 torr at an evaporation rate of 3Å /sec. Cu2S has direct band gap energy and indirect band gap energy at 1.2eV and 1.8 eV respectively. This paper presents the analysis of structural and optical properties of the Cu2S thin film by X-ray diffractometer (XRD) and UV-Vis-NIR Spectrophotomet...
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