due to the expected increase of defects in circuits based on deep submicron technologies, reliability has become an important design criterion. although different approaches have been developed to estimate reliability in digital circuits and some measuring concepts have been separately presented to reveal the quality of analog circuit reliability in the literature, there is a gap to estimate re...

Due to the expected increase of defects in circuits based on deep submicron technologies, reliability has become an important design criterion. Although different approaches have been developed to estimate reliability in digital circuits and some measuring concepts have been separately presented to reveal the quality of analog circuit reliability in the literature, there is a gap to estimate re...

Dedication My thanks go, as always, to my maternal grandparents, to whom this dissertation is dedicated. I am indebted to my maternal grandparents for standing beside me all these years and constantly motivating me in my efforts. I wouldn't have been what I am, without their help. And My thanks go to my supervising professor, Nur A. Touba. v Acknowledgements I wish to thank my advisor, Professo...

electric power industry have always try to provide reliable electricity to customers and at the same time decrease system costs. high voltage circuit-breakers are an essential part of the power network. this study has developed a maintenance and replacement scheduling model for high voltage circuit- breakers that minimize maintenance costs while maintaining the acceptable reliability. this mode...

The intrinsic failure mechanisms and reliability models of state-of-the-art MOSFETs are reviewed. The simulation tools and failure equivalent circuits are described. The review includes historical background as well as a new approach for accurately predicting circuit reliability and failure rate from the system point of view. 2006 Elsevier Ltd. All rights reserved.

Title of dissertation: DEEP SUBMICRON CMOS VLSI CIRCUIT RELIABILITY MODELING, SIMULATION AND DESIGN Xiaojun Li, Doctor of Philosophy, 2005 Dissertation directed by: Professor Joseph B. Bernstein Reliability Engineering CMOS VLSI circuit reliability modeling and simulation have attracted intense research interest in the last two decades, and as a result almost all IC Design For Reliability (DFR)...

Due to shrinking feature size and significant reduction in noise margins, nanoscale circuits have become more susceptible to manufacturing defects, noise-related transient faults and interference from radiation. Traditionally, soft errors have been a much greater concern in memories than in logic circuits. However, as technology continues to scale, logic circuits are becoming more susceptible t...