A previous hierarchical fault tracing method for combinational circuits which requires only CAD layout data in the CAD-linked electron beam test system is expanded as applicable to sequential circuits. The characteristics in the method remains unchanged that allows us to trace a fault hierarchically from the top level cell to the lowest primitive cell and from the primitive cell to the transist...

Integration of circuit CAD activities into a single design framework requires that CAD data of widely diiering forms be integrated into a single design database. This results in data which is highly structured, multi-dimensional and very complex; most current database models (for example the relational model) lack the expressive power to eeciently represent such data. The authors have developed...

Design automation or computer-aided design (CAD) for microelectronic circuits has emerged since the creation of the integrated circuits (IC). It has played a crucial role to enable the rapid development of hardware and software systems in the past several decades. CAD techniques are the key driving forces behind the reduction of circuit design time and the optimization of the circuit quality. M...

in this paper a novel design of all-optical half-subtractor based on nonlinear directional coupler is proposed. by using four waveguides and appropriately adjusting the refractive indices and selecting the proper length of waveguides, halfsubtractor function can be obtained. the operation of this function is simulated by rsoft cad-layout (beamprop) simulator. the simulation results confirm the ...