atomic force microscopy (afm) is a three-dimensional topographic technique with a high atomic resolution to measure surface roughness. afm is a kind of scanning probe microscope, and its near-field technique is based on the interaction between a sharp tip and the atoms of the sample surface. there are several methods and many ways to modify the tip of the afm to investigate surface properties, ...

Atomic force microscopy (AFM) is a three-dimensional topographic technique with a high atomic resolution to measure surface roughness. AFM is a kind of scanning probe microscope, and its near-field technique is based on the interaction between a sharp tip and the atoms of the sample surface. There are several methods and many ways to modify the tip of the AFM to investigate surface properties, ...

In this study, we present a new technique called correlative atomic force and transmission electron microscopy (correlative AFM/TEM) in which a targeted region of a sample can be observed under AFM and TEM. The ultimate goal of developing this new technique is to provide a technical platform to expand the fields of AFM application to complex biological systems such as cell extracts. Recent adva...

The objectives of this study were to evaluate the usefulness of DArT markers in genotypic identification of willow species and describe genetic relationships between four willow species: Salix viminalis, S. purpurea, S. alba and S. triandra. The experimental plant material comprised 53 willow genotypes of these four species, which are popularly grown in Poland. DArT markers seem to identify Sal...

bacteriorhodopsin (br) is the light harvesting and photoactive proton pump found in the membrane of a salt marsh bacteria. this protein has significant potential to use in optical computing and memory devices due to unique intrinsic physical properties of photo and bioelectric. all these features make br one of the most promising protein candidates in protein memories. protein memory is a kind ...

A novel calibration technique has been developed for lateral force microscopy (LFM). Typically, special preparation of the atomic force microscope (AFM) cantilever or a substrate is required for LFM calibration. The new calibration technique reported in this paper greatly reduces the required preparation processes by simply scanning over a rigid step and measuring the response of the AFM photod...

Atomic force microscopy (AFM) is a three-dimensional topographic technique with a high atomic resolution to measure surface roughness. AFM is a kind of scanning probe microscope, and its near-field technique is based on the interaction between a sharp tip and the atoms of the sample surface. There are several methods and many ways to modify the tip of the AFM to investigate surface properties, ...

Twist grain boundary (TGB) phases represent liquid crystalline systems with a regular array of defects. In our research, we studied compound stable TGBC phase and pursued its structure using various experimental techniques. Using AFM microscope, observed the surface smectic film detected periodic relief. We found that displacement amplitude is few nanometres, periodicity about 500 nm. Such in a...