We measure the infrared spectra of polyethylene nanostructures of height 15 nm using atomic force microscope infrared spectroscopy (AFM-IR), which is about an order of magnitude improvement over state of the art. In AFM-IR, infrared light incident upon a sample induces photothermal expansion, which is measured by an AFM tip. The thermomechanical response of the sample-tip-cantilever system resu...

We study the influence of the contact stiffness and the ration between cantilever and tip lengths on the resonance frequencies and sensitivities of lateral cantilever modes. We derive expressions to determine both the effective resonance frequency and the mode sensitivity of an atomic force microscope (AFM) rectangular cantilever. Once the contact stiffness is given, the resonance frequency and...

We describe a novel and simple operation method of using a self-sensitive cantilever of an atomic force microscopy (AFM) system in liquid. As for operation of the cantilever in liquid, Al lines of an integrated piezoresistor patterned on the cantilever are easily damaged by electrochemical corrosion. To realize safe operation without the damage, an additional electrode was inserted into the liq...

Abbreviations a 1 , a 2 , a 3 , a 4 and A 1 , A 2 , A 3 , A 4 Constants in the shape function y(x) a C Contact radius α Wave number of the flexural waves A Cross-section area of the cantilever b Thickness of the cantilever c P Ratio φ Lat /φ d Y 0 , d X0 Normalized amplitude of the sensor tip in y-and x-direction, respectively δ n , δ L Normal, lateral contact deflection (in the coordinate syst...

We find that the 'jump-into-contact' of the cantilever in the atomic force microscope (AFM) is caused by an inherent instability in the motion of the AFM cantilever. The analysis is based on a simple model of the cantilever moving in a nonlinear force field. We show that the 'jump-into-contact' distance can be used to find the interaction of the cantilever tip with the surface. In the specific ...

The attachment of an antibody to an antigen-coated cantilever has been investigated by repeated experiments, using a cantilever-based detection system by Cantion A/S. The stress induced by the binding of a pesticide residue BAM (2,6 dichlorobenzamide) immobilized on a cantilever surface to anti-BAM antibody is measured using the CantiLab4© system from Cantion A/S with four gold-coated cantileve...

We numerically explore the nonlinear dynamics of the oscillating cantilever tip in tapping mode atomic force microscopy. The cantilever dynamics are determined by complex force interactions between the sample surface and the oscillating cantilever tip which are dominated by attractive, adhesive, and repulsive contributions depending on the instantaneous position of the cantilever. We use a mode...

In this paper, the design of silicon based cantilevers for scanning probe microscopy has been described in detail. ANSYS software has been used as a tool to design and model the mechanical properties of the silicon based cantilevers. The incorporation of stress concentration regions (SCRs) with a thickness smaller than the cantilever thickness, to localize stresses, has been explored in detail ...

Atomic force microscopy (AFM) is a technique to image surfaces with unprecedented vertical and lateral resolution. Many related techniques have been derived from AFM, taking advantage of local interactions between a tip on a cantilever and a surface. However, cantilevers can also be used for sensing applications. These so-called nanosensors feature extreme sensitivity for the detection of chemi...

We critically discuss the extraction of intrinsic cantilever properties, namely eigenfrequency f n , quality factor Q n and specifically the stiffness k n of the nth cantilever oscillation mode from thermal noise by an analysis of the power spectral density of displacement fluctuations of the cantilever in contact with a thermal bath. The practical applicability of this approach is demonstrated...