Ensuring a high level of service reliability is of paramount importance in an all-electric ship. In the literature, shipboard power systems (SPS) have been designed for improved survivability and quality of service (QOS) requirements. This paper presents a two-level topology design approach and develops system-level architectures for SPS that ensure continuity of service and survivability in th...

A broad review the literature for Reliabilityand Process-variation aware VLSI design shows a re-emergence of the topic as a core area of active research. Design of reliable circuits with unreliable components has been a challenge since the early days of electro-mechanical switches and have been addressed by elegant coding and redundancy techniques. And radiation hard design principles have been...

This paper investigates technical and organizational tools to improve performances of a multi-state degraded system subject to multiple competing failure processes. The competing failure processes treated in this paper are oil insulating aging and electrical contacts wear out of high voltage oil circuit breaker. To degradation processes, is associated random shocks process highlighted by the st...

generally, the failure rate and the repair time of system components are constant parameters in reliability assessment of electric distribution systems. a failure of component is resulted from failing in the operation or overloading. in addition, there exist cases where, the repair times of components are small and tolerable from customer point of view. thus, tolerable repair times may be overl...

1. INTRODUCTION In the quantum computational framework there are polynomial time solving algorithms, for problems having exponential classical solutions. The quest is – on one hand – to search if there are other possible effective quantum algorithms and – on the other hand – to be able to produce efficient implementations for the already known algorithms. The most feasible implementation of qua...

A new Schmitt trigger circuit, which consists of low-voltage devices, can receive the high-voltage signal without gate-oxide reliability problem, is proposed. The new proposed circuit, which can operate in a 3.3 V signal environment without suffering high-voltage gate-oxide stress, has been fabricated in a 0.13 μm 1/2.5 V CMOS process. The experimental results show that the measured transition ...