نتایج جستجو برای: dielectric degradation
تعداد نتایج: 189549 فیلتر نتایج به سال:
RF MEMS capacitive switches show great potential for use in wireless communication device. However, their widespread insertion in commercial products requires further improvements in their longterm reliability. Dielectric charging is one of the factors that impact switch reliability. Dielectric charging is understood to mean the accumulation of electric charge in the insulating dielectric layer...
The performance of piezoelectric vibration energy harvesters was studied as a function of environment temperature. The devices fabricated by soft or hard PZTs were used to investigate the effect of material parameters on the thermal degradation of the devices. PZT MEMS device was also prepared and compared with the bulk devices to investigate scaling effect on the thermal degradation. All devic...
We present a comprehensive review of product level reliability challenges for the 65nm technology node. The major reliability degradation mechanisms are analyzed for CMOS technologies. Historical data will show that hot carrier degradation has lost on importance and that negative bias temperature instability (NBTI) is the leading reliability concern for the 65nm technology node. Additionally, d...
The objective of this presentation is to gain insight into possible failure mechanisms in BaTiO3-based ceramic capacitors that may be associated with the reliability degradation that accompanies a reduction in dielectric thickness, as reported by Intel Corporation in 2010. The volumetric efficiency (μF/cm) of a multilayer ceramic capacitor (MLCC) has been shown to not increase limitlessly due t...
grading of agricultural products has always been a subject of research by scientists. one of the criteria to be chosen for grading of fruits is the fruit's level of ripeness. different methods have been employed to assess the status of fruit ripeness some of which are destructive and others are not so. in this research, a noninvasive capacitive method was used to estimate the ripeness leve...
some issues; leakage, tunneling currents, boron diffusion are threatening sio2 to be used as a good gate dielectric for the future of the cmos (complementary metal- oxide- semiconductor) transistors. for finding an alternative and novel gate dielectric, the nio (nickel oxide) and pva (polyvinyl alcohol) nano powders were synthesized with the sol-gel method and their nano structural properties w...
The advances in theranostic technologies based on the interaction of electromagnetic fields with biological tissues led to the development of dielectric spectroscopy, with particular attention to the living biological tissue. This STSM aimed to the measurements of the dielectric properties of an original in vivo breast model realized in a rat and simulating the actual condition of a human breas...
نمودار تعداد نتایج جستجو در هر سال
با کلیک روی نمودار نتایج را به سال انتشار فیلتر کنید