نتایج جستجو برای: circuit reliability

تعداد نتایج: 254412  

2016
Hualin Chen Lan Chen

With the continuous miniaturization, electrical, high-speed and intelligent of railway signal equipment, the control switch module must have higher safety, reliability and anti-interference ability. Under this background, this paper studied the railway signal distributed computer control switch module. First of all, this paper introduced the main supporting technology of distributed interlockin...

1994
Edgar Holmann G. Leonard Tyler Ivan R. Linscott

An exact, practical implementation of reliability calculation for combinational circuits can be based on a hierarchical decomposition of the circuit into manageable sub{units, and construction of exact summary tables for each sub{unit. For a simple example of voting logic, this exact reliability analysis reaarms that the reliability of the individual voter inputs is as important as the voter re...

Journal: :Electr. J. Comb. 2012
Klaus Dohmen Peter Tittmann

In this paper, we propose a new network reliability measure for some particular kind of service networks, which we refer to as domination reliability. We relate this new reliability measure to the domination polynomial of a graph and the coverage probability of a hypergraph. We derive explicit and recursive formulæ for domination reliability and its associated domination reliability polynomial,...

2001
Antonello Monti Enrico Santi Roger Dougal Ferdinanda Ponci Marco Riva

This paper presents a methodology for automatically extracting an equivalent circuit model starting from a set of equations. Once the device models are built, they can be easily handled and interconnected. This method therefore proves to be particularly suitable for large system studies using an object oriented implementation. The proposed methodology involves the following steps. The equations...

2016
Filipp Akopyan Carlos Tadeo Rajit Manohar

In the era of high-speed and low-power VLSI circuits, the question of which circuit family is best for a given application has become extremely relevant. From a designer’s perspective, technology miniaturization brings increased parameter variation and decreased reliability, which lead to circuit malfunction. To mitigate the risks of undesirable circuit behavior, a designer has to make decision...

Journal: :Int. J. Systems Assurance Engineering and Management 2010
Gerd H. Kjølle Oddbjørn Gjerde

The methods and tools needed for security of supply assessment range from long term market models for predicting future generation and load patterns to more detailed network simulation models for analyzing contingencies and reliability of supply for delivery points. This paper describes an integrated approach for security of electricity supply analysis, by the integration of power system reliab...

2011
Takashi Matsumoto Kazutoshi Kobayashi Hidetoshi Onodera

We investigate a synchronous circuit reliability for 65nm−40nm CMOS technology. The impact of Random telegraph noise (RTN) and Negative Bias Temperature Instability (NBTI) on a circuit is evaluated. We found two things. (i) RTN at one or a few stages of a combinational circuit induces a large delay fluctuation under low voltage operation. (ii) LSI lifetime can be extended by utilizing NBTI reco...

2003
Ketan N. Patel Igor L. Markov John P. Hayes

Circuit reliability is an increasingly important design consideration for modern logic circuits. To this end, our work focuses on the evaluation of circuit reliability under probabilistic gate-level fault models that can capture both soft errors, e.g., radiation-related, and spatially-uniform manufacturing defects. This basic task can, in principle, be used (i) by synthesis procedures to select...

2016
Sungwoo Bae Myung Chin Kim

In order to realize a true WoT environment, a reliable power circuit is required to ensure interconnections among a range of WoT devices. This paper presents research on sensors and their effects on the reliability and response characteristics of power circuits in WoT devices. The presented research can be used in various power circuit applications, such as energy harvesting interfaces, photovo...

2007
Erin Taylor Jose Fortes

Well-established reliability models indicate that the failure rates of scaled CMOS will continue to increase due to manufacturing variability and wear-out caused by negative bias temperature instability and hot carrier injection effects. Thus, the reliability of future devices is a critical concern for circuit designers. In order to predict the feasibility and reduce the cost of these new, faul...

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