The electronic current transformer plays an irreplaceable position in the field of relay protection and current measurement of the power system. Rogowski coils are used as sensor parts, and in order to improve the measurement accuracy and reliability, the circuits at the high voltage system are introduced and improved in this paper, including the analog integral element, the filtering circuit a...

Process variations and device aging impose profound challenges for circuit designers. Without a precise understanding of the impact on delay paths, guardbands, which keep timing violations at bay, cannot be correctly estimated. This problem is exacerbated advanced technology nodes, where transistor dimensions reach atomic levels established margins are severely constrained. Hence, traditional w...

Negative Bias Temperature Instability(NBTI) has become an important reliability concern for ultra-scaled Silicon IC technology with significant implications for both analog and digital circuit design. As the Integrated Circuits (IC) density keeps on increasing with the scaling of CMOS devices in each successive technology generation, stress analysis or reliability concerns mainly Negative Bias ...

Process Variation has become a crucial challenge on both interconnect delay and reliability of nanometer integrated circuit designs. Furthermore, the dramatic increase of power consumption and integration density has led to high operating temperature. Temperature, as well as electromigration (EM) and power, also significantly affects the delay and reliability of interconnects. Considering proce...

Critical systems like pace-makers, defibrillators, wearable computers and other electronic gadgets have to be designed not only for reliability but also for ultra-low power consumption due to limited battery life. This paper explores architecture, logic and circuit level approaches to this tradeoff. Fault tolerance techniques at the architecture level can be broadly classified into spatial or t...