SRAM-Filed Programmable Gate Arrays (FPGA) have become one of the most important carriers of digital electronic system because of its many inborn advantages. However, as manufacture of Integrated Circuit evolves towards Very Deep Sub-Micron technology, FPGA designers must be careful of circuit’s Single Event Upset (SEU) susceptibility when used in hostile environment, such as avionics and space...

Analyzing and evaluating the sensitivity of embedded systems to soft-errors have always been a challenge for aerospace or safety equipment designer. Different automated fault-injection methods have been developed for evaluating the sensitivity of integrated circuit. Also many techniques have been developed to get a fault tolerant architecture in order to mask and mitigate fault injection in a c...

-The goal f the NASA HPCC Remote Exploration and Experimentation (REE) Project is to transfer commercial supercomputing technology into space. The project will use state of the art, low-power, nonradiation-hardened, commercial Off-The-Shelf (COTS) hardware chips and COTS software to the maximum extent possible, and will rely on Software-Implemented Fault Tolerance (SIFT) to provide the required...

-The goal of the NASA HPCC Remote Exploration and Experimentation (REE) Project is to transfer commercial supercomputing technology into space. The project will use state of the art, low-power, non-radiationhardened, Commercial Off-The-Shelf (COTS) hardware chips and COTS software to the maximum extent possible, and will rely on Software-Implemented Fault Tolerance (SIFT) to provide the require...

Radiation induced failure modes of the Virtex I family have already been analyzed in the past. About configuration logic in particular, at least three kinds of Single Event Functional Interrupts (SEFIs) were believed to exist in the Virtex I, as a consequence of Single Event Upsets [1]: 1) JTAG TAP controller upset; 2) configuration control state machines reset (FSM POR SEFI); 3) SelectMAP conf...

Three layout-hardened Dual Interlocked Storage Cell (DICE) D Flip-Flops (DFFs) were designed and manufactured based on an advanced 28 nm planar technology. The systematic vertical tilt heavy ion irradiations demonstrated that the DICE structure contributes to radiation tolerance. However, it is hard achieve immunity from a Single Event Upset (SEU), even when ~3-µm well isolation utilized. SEU m...

Recent improvements in the radiation transport code HZETRN/BRYNTRN and galactic cosmic ray environmental model have provided an opportunity to investigate the effects of target fragmentation on estimates of single event upset (SEU) rates for spacecraft memory devices. Since target fragments are mostly of very low energy, an SEU prediction model has been derived in terms of particle energy rathe...

Several very large scale integrated (VLSI) devices which are not available in radiation hardened version are still required to be used in spacecraft systems. Thus these components need to be tested for highenergy heavy ion irradiation to find out their tolerance and suitability in specific space applications. This paper describes the high-energy heavy ion radiation testing of VLSI devices for s...

Orbital remote sensing instruments and systems can benefit from high performance, adaptable components. Field programmable SRAM-based gate arrays (FPGAs) are usually the chosen platform for real-time reconfigurable computing. This technology is driven by the commercial sector, so devices intended for the space environment must be adapted from commercial products. Total ionizing dose (TID), heav...

The microstrip tracker for the CMS experiment at the LHC will be read out using radiation hard APV chips. During high luminosity running of the LHC the tracker will be exposed to particle fluxes up to 10 cm s. This high rate of particles introduces a concern that the APV could occasionally suffer from Single Event Upset (SEU). In order to evaluate the expected upset rate the APV was run under c...