نتایج جستجو برای: circuit reliability

تعداد نتایج: 254412  

2007
Timothy J. Dysart Peter M. Kogge

Since nanoelectronic devices are likely to be defective and error-prone, developing an understanding of circuit reliabilities and critical components will be required. In this paper, probabilistic transfer matrices are used to compare the reliability of a small multiplier circuit when considering both magnetic and molecular QCA implementations. These implementations are considered since the cir...

2016
Ahmed Khelassi Didier Theilliol Philippe Weber

This paper interests to the properties of fault-tolerant control system with respect to reliability of components. The aim of this paper is to present the need of reliability analysis in fault-tolerant control design. The focus of our study is on the reconfigurability analysis of systems with actuator faults under reliability constraints. This analysis proves that control reconfigurability is a...

2004
Syed M. Alam

Total on-chip interconnect length has been increasing exponentially with technology scaling. Consequently, interconnect-driven design is an emerging trend in state-ofthe-art integrated circuits. Cu-based interconnect technology is expected to meet some of the challenges of technology scaling. However, Cu interconnects still pose a reliability concern due to electromigration-induced failure over...

2004
Jiann S. Yuan

This paper presents a design methodology to study RF circuit performance degradations due to hot carrier and soft breakdown. The experimental facts of DC stress on the RF properties of MOSFETs are given. The equivalent circuit model is developed and verified by measurement data. RF circuit such as a low noise amplifier is evaluated using SPICE circuit simulation. Noise figure and s-parameter de...

2007
Oana Boncalo

This report aims at presenting the research program and to review the literature describing quantum computing, quantum fault tolerance issues and classical fault injection. Thus, previous work is presented together with future research directions. The proposed PhD research program aims at developing a methodology for simulation based fault injection for quantum circuits. Through simulation, I o...

Journal: :IEEE Journal on Selected Areas in Communications 1989
Bezalel Gavish Pierre Trudeau Moshe Dror Michel Gendreau Lorne Mason

The network design problem with reliability constraints is a problem where, given a finite set of nodes, the objective is a costefficient selection of links and link capacities sufficient to satisfy the node-to-node traffic demands in normal and failed conditions. In this paper, we present a general mathematical model for this problem and a revised formulation which seems particularly appropria...

2011

The multi-agent system (MAS) approach has been applied with promising results for enhancing an electric power distribution circuit, such as the Circuit of the Future as developed by Southern California Edison. These next generation power system results include better ability to reconfigure the circuit as well as the increased capability to improve the protection and enhance the reliability of t...

2012
Qiuzhan Zhou Jian Gao

With the rapid development of the information and science, more and more newly semiconductor devices are used in the electronic equipments or systems, and so is the Optoelectronic Coupled Devices (OCDs). Because of excellent characteristics of it such as small size, long life, non-contact mode and strong anti-interference, OCDs can replace many kinds of devices e.g. relays, transformers, choppe...

2009
WANG Yu LUO Hong HE Ku LUO Rong YANG Huazhong XIE Yuan

Negative bias temperature instability (NBTI), which causes temporal performance degradation in digital circuits by affecting PMOS threshold voltage, has become the dominant circuit lifetime reliability factor. Design for lifetime reliability, especially for NBTI-induced circuit performance degradation, is emerging as one of the major design concerns. In this paper, an NBTI-aware dual Vth assign...

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