نتایج جستجو برای: defect detectability

تعداد نتایج: 99914  

Journal: :J. Imaging 2015
Christiane Maierhofer Philipp Myrach Rainer Krankenhagen Mathias Röllig Henrik Steinfurth

Lockin thermography is a well-suited method for the characterization of structures made of both metal and fiber reinforced plastic. In most cases, only phase images are analyzed, although the amplitude images might contain useful information as well. Thus, systematic studies of lockin thermography are presented, assessing amplitude and phase images for the detection and quantification of defect...

2010
Fengyun Xie Jihui Zhou

Eddy current testing is a kind of non-destructive testing (NDT) method based on the principle of electromagnetic induction. The probe is the key of eddy current non-destructive inspection and its design or combination of form will influence detectability. A complete set of eddy current testing system is designed for standard testing copper and defect copper. Under the same liftoff distance and ...

Journal: :Investigative ophthalmology & visual science 1985
J Flammer S M Drance L Augustiny A Funkhouser

A method to quantify different glaucomatous visual field defects is presented. Three visual field indices are calculated: the short-term fluctuation, the mean defect, and the corrected loss variation. The method was applied to visual fields tested with program JO on the Octopus automated perimeter. The indices of 130 glaucoma suspects and 50 glaucoma patients were compared with 100 normal contr...

Journal: :journal of paramedical sciences 0
maryam mojiri radiology department, paramedical school, hamadan university of medical science, hamadan karim ghazi khanloo sani radiology department, paramedical school, hamadan university of medical science, hamadan abbas moghimbeigi department of biostatistics and epidemiology, research center for health sciences, hamadan university of medical science, hamadan

accurate interpretation of radiographic images is dependent on viewing conditions. recently the number of radiology departments has been increased so it needs to use a workstation for reporting. the aim of this study was assess monitor performance and the effect of viewing conditions on object detection. this investigation aimed to quantify the effects of changes in box brightness and ambient l...

2016
Yasuyuki Takahashi Mizuki Mochiki Keiko Koyama Toshihiko Ino Hiroyuki Yamaji Atsuko Kawakami

OBJECTIVES Use of a positron emission tomography (PET)/single-photon emission computed tomography (SPECT) system facilitates the simultaneous acquisition of images with fluorine-18 fluorodeoxyglucose ((18)F-FDG) and technetium ((99m)Tc)-tetrofosmin. However, (18)F has a short half-life, and 511 keV Compton-scattered photons are detected in the (99m)Tc energy window. Therefore, in this study, we...

Journal: :J. Electronic Testing 2007
Zhanglei Wang Krishnendu Chakrabarty

We propose a built-in self-test (BIST) procedure for nanofabrics implemented using chemically assembled electronic nanotechnology. Several fault detection configurations are presented to target stuck-at faults, shorts, opens, and connection faults in nanoblocks and switchblocks. The detectability of multiple faults in blocks within the nanofabric is also considered. We present an adaptive recov...

2015
Xiuyun Zhou Jinlong Zhou Guiyun Tian Yizhe Wang

In order to solve tiny defect detection for solder balls in high-density flip-chip, this paper proposed feasibility study on the effect of detectability as well as classification based on eddy current pulsed thermography (ECPT). Specifically, numerical analysis of 3D finite element inductive heat model is generated to investigate disturbance on the temperature field for different kind of defect...

1996
Jonathan T.-Y. Chang Edward J. McCluskey

The detectability of delay flaws can be improved by testing CMOS IC's with a very low supply voltage -between 2 and 2.5 times the threshold voltage Vt of the transistors. A delay flaw is a defect that causes a local timing failure but the failure is not severe enough to cause malfunctioning. Delay flaws caused by degraded signals and gates with lower drive capability than expected are considere...

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