نتایج جستجو برای: afm technique

تعداد نتایج: 621308  

2016
Y. G. Lu Z. W. Zhong H. M. Xie

In this article, the feasibility of atomic force microscope AFM scanning moiré on a cross-line diffraction grating has been studied. The AFM scanning moiré technique has been applied to measure the thermal deformation of electronic packages successfully. This technique is convenient to perform the mismatch method, also it could obtain a higher resolution than any other moiré method. © 2001 Amer...

2017

FM-AFM is an extremely powerful and versatile imaging technique capable of atomic resolution imaging in vacuum, air or liquid. However, obtaining such results in practice currently requires tedious and time consuming manual tuning of many feedback parameters by trial and error. We present a recently developed algorithm for automated tuning of FM-AFM feedback parameters. The algorithm optimizes ...

2017

FM-AFM is an extremely powerful and versatile imaging technique capable of atomic resolution imaging in vacuum, air or liquid. However, obtaining such results in practice currently requires tedious and time consuming manual tuning of many feedback parameters by trial and error. We present a recently developed algorithm for automated tuning of FM-AFM feedback parameters. The algorithm optimizes ...

Journal: :Physical review letters 2002
Matthew S Marcus Robert W Carpick Darryl Y Sasaki M A Eriksson

Phase contrast in intermittent-contact atomic force microscopy (AFM) reveals in-plane structural and mechanical properties of polymer monolayers. This is surprising, because measurements of nanoscale in-plane properties typically require contact mode microscopies. Our measurements are possible because the tip oscillates not just perpendicular but also parallel to the sample surface along the lo...

Journal: :international journal of advanced design and manufacturing technology 0
ali kiani mojtaba esmailian hosein amirabadi associate professor, department of mechanical engineering

the abrasive flow machining technique uses a self-deforming tool, an abrasive laden media that is passed back and forth in the passage geometry of the hollow workpiece with the assistance of two hydraulically operated cylinders placed opposite to each other. the material is removed by abrasion generating finer surfaces in the area where flow is restricted. but this method has a low material rem...

Journal: :The Review of scientific instruments 2009
J I Kilpatrick A Gannepalli J P Cleveland S P Jarvis

Frequency modulation atomic force microscopy (FM-AFM) is rapidly evolving as the technique of choice in the pursuit of high resolution imaging of biological samples in ambient environments. The enhanced stability afforded by this dynamic AFM mode combined with quantitative analysis enables the study of complex biological systems, at the nanoscale, in their native physiological environment. The ...

Journal: :Microelectronics Reliability 2002
Huimin Xie Anand K. Asundi Chai Gin Boay Lu Yunguang Jin Yu Zhaowei Zhong Bryan K. A. Ngoi

The formation mechanism of atomic force microscope (AFM) Moir e is explained using the transmittance function. The technique for preparing the AFM Moir e specimen grating is described. The sensitivity and accuracy of this method is analyzed. AFM Moir e method is used to measure the thermal deformation ball grid array (BGA) electronic package. The shear strain at the different solders in the BGA...

Journal: :Skin research and technology : official journal of International Society for Bioengineering and the Skin (ISBS) [and] International Society for Digital Imaging of Skin (ISDIS) [and] International Society for Skin Imaging 2010
R M Gaikwad S I Vasilyev S Datta I Sokolov

BACKGROUND/PURPOSE Atomic force microscopy (AFM) is a novel technique for skin characterization. OBJECTIVES To develop AFM tests for characterization of the outermost epidermis layer, corneocytes. As an example, the effect of moisturizer on the corneocyte properties is studied. METHODS AND MATERIALS Topology, rigidity, and friction (between individual corneocytes and AFM probe) of the top l...

Journal: :Microscopy research and technique 2004
Bartek Rajwa Helen A McNally Padma Varadharajan Jennifer Sturgis J Paul Robinson

There is a vast difference in the traditional presentation of AFM data and confocal data. AFM data are presented as surface contours while confocal data are usually visualized using either surface- or volume-rendering techniques. Finding a common meaningful visualization platform is not an easy task. AFM and CLSM technologies are complementary and are more frequently being used to image common ...

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