نتایج جستجو برای: single error upset seu
تعداد نتایج: 1116761 فیلتر نتایج به سال:
Memory scrubbing is used to mitigate SEU on susceptible devices. In the case of FPGAs, configuration memory scrubbing is generally used in conjunction with triple modular redundancy (TMR) to increase the reliability of FPGA systems in space borne applications. Reported solutions require a subsystem able to read and write from the configuration memory and retrieve from a “safe storage” a golden ...
Computer Systems which operate in space environment are Subject to different radiation phenomena that lead to soft errors and can cause unpredictable behaviours of computer-based systems. Commercial Off-The Shelf (COTS) equipment which is commonly used in space missions cannot tolerate some threats such as Single Event Upsets (SEU). Therefore, there are some considerations in resisting this equ...
This article may be used for research, teaching and private study purposes. Any substantial or systematic reproduction, redistribution , reselling , loan or sub-licensing, systematic supply or distribution in any form to anyone is expressly forbidden. This paper presents a new hybrid fault-tolerant architecture for robustness improvement of digital CMOS circuits and systems. It targets all kind...
Functional safety is a key requirement in several application domains which microprocessors are an essential part. A number of redundancy techniques have been developed with the common purpose protecting circuits against single event upset (SEU) faults. In microprocessors, functional may be achieved through multi-core or simultaneous-multi-threading architectures, that broadly classifiable as D...
Hybrid spacecraft processing platforms that combine radiation-hardened components with commercialgrade COTS components have the potential to dramatically improve performance while reducing overall project cost and risk. However, the susceptibility of COTS components to single-event upsets and other radiation effects can diminish their benefits without adequate mitigation techniques. As a major ...
The continuous scaling of electronic components has led to the development high-performance microprocessors that are suitable even for safety-critical applications where radiation-induced errors such as Single Event Effects (SEEs) can have a significant impact on performance and reliability system. This work is dedicated investigating systems based programmable hardware Real-time operating Syst...
The interaction of radiation with matter is a very broad and complex topic. In this chapter we try to analyse the problem with the aim of explaining, at least qualitatively, the more important aspects which are essential for a physical comprehension of the degradation observed in MOS devices and circuits when they are irradiated. In section 1.1 we introduce the effects of the interaction of var...
Resumo A Computação Ub́ıqua impôs uma série de requisitos adicionais ao desenvolvimento de software. Dentre esses desafios, tem-se a necessidade de adaptar o conteúdo e o comportamento das aplicações à heterogeneidade dos dispositivos computacionais dos usuários, bem como ao ambiente no qual eles estão imersos. Face a esses desafios, propôs-se o processo Model Driven RichUbi para apoiar o desenv...
The architecture and implementation of the LEON-FT processor is presented. LEON-FT is a fault-tolerant 32-bit processor based on the SPARC V8 instruction set. The processors tolerates transient SEU errors by using techniques such as TMR registers, on-chip EDAC, parity, pipeline restart, and forced cache miss. The first prototypes were manufactured on the Atmel ATC35 0.35 µm CMOS process, and su...
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