نتایج جستجو برای: ultra thin film

تعداد نتایج: 240251  

2006
Xiaodong Han Shengcheng Mao Qun Wei YueFei Zhang Ze Zhang

In-situ TEM studies were conducted to reveal the crystallization features of equi-atomic TiNi amorphous thin films. The TiNi amorphous thin film crystallization procedure can be divided to be two types: the in-homogenous nucleation and growth mode in the ultra thin regions and the homogenous polymorphous mode in the thick areas. In the thin regions, the thickness controls the in-homogenous nucl...

2007
Pavel Steffan Radimír Vrba

The paper describes new approach of potentiostat for very low sensor current measurements. Recent potentiostats were used as measurement devices which were standalone and sensors were connected by a screened wire. These concepts are inconvenient for the presented very low current measurements. The new approach is based on the potentiostat circuitry integrated on a chip that should be directly c...

2007
D. Ngo X. Feng Y. Huang

Current methodologies used for the inference of thin film stress through curvature measurements are strictly restricted to stress and curvature states which are assumed to remain uniform over the entire film/substrate system. Recently Huang, Rosakis and co-workers [Huang, Y., Ngo, D., Rosakis, A.J., 2005. Non-uniform, axisymmetric misfit strain: in thin films bonded on plate substrates/substrat...

پایان نامه :وزارت علوم، تحقیقات و فناوری - دانشگاه تهران 1387

چکیده ندارد.

Journal: :journal of nanostructures 2013
p. balashabadi z. assadollahi m. ghasemi h. bakhtiari e. jafari-khamse

a cylindrical direct current magnetron sputtering coater with two targets for deposition of multilayer thin films and cermet solar selective surfaces has been constructed. the substrate holder was able to rotate around the target for obtaining the uniform layer and separated multilayer phases. the al/ cu multilayer film was deposited on the glass substrate at the following conditions: working g...

Journal: :Microelectronics Reliability 2002
Adelmo Ortiz-Conde Francisco J. García-Sánchez Juin J. Liou Antonio Cerdeira Magali Estrada Y. Yue

The threshold voltage value, which is the most important electrical parameter in modeling MOSFETs, can be extracted from either measured drain current or capacitance characteristics, using a single or more transistors. Practical circuits based on some of the most common methods are available to automatically and quickly measure the threshold voltage. This article reviews and assesses several of...

2016
Dong Wu Yumin Liu Ruifang Li Lei Chen Rui Ma Chang Liu Han Ye

We propose and numerically investigate a novel perfect ultra-narrow band absorber based on a metal-dielectric-metal-dielectric-metal periodic structure working at near-infrared region, which consists of a dielectric layer sandwiched by a metallic nanobar array and a thin gold film over a dielectric layer supported by a metallic film. The absorption efficiency and ultra-narrow band of the absorb...

2011
Jagadeesh Moodera Caroline Ross Samuel Allen

Essential to the emergence of spin-based electronics is a source of highly polarized electron spins. Conventional ferromagnets have at best a spin polarization P~50%. Europium monoxide is a novel material capable of generating a highly spin-polarized current when used as a tunnel barrier. EuO is both a Heisenberg ferromagnet (Tc=69 K) and a semiconductor. Exchange splitting of the conduction ba...

2002
E. J. Widjaja L. D. Marks

In situ studies have been performed on thin films in the Al rich region of the Al–Cu–Fe–Cr quasicrystalline phase field. Thin films were grown by magnetron sputtering on atomically flat MgO (0 0 1) and Al O (0 0 0 1) and subsequently studied by 2 3 transmission electron microscopy and X-ray photoelectron spectroscopy. High resolution electron microscopy shows that thin films (-30 nm) grown at r...

Journal: :Nano letters 2017
X X Yu A Gulec A Yoon J M Zuo P W Voorhees L D Marks

We report direct observation of a "Pac-Man" like coarsening mechanism of a self-supporting thin film of nickel oxide. The ultrathin film has an intrinsic morphological instability due to surface stress leading to the development of local thicker regions at step edges. Density functional theory calculations and continuum modeling of the elastic instability support the model for the process.

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