نتایج جستجو برای: single error upset seu

تعداد نتایج: 1116761  

2013
Kjell Arne Ødegaard Amund Skavhaug

The objective of this paper is to propose a low-cost, robust Error Detection And Correction (EDAC) solution for use in applications such as nano satellites, where price is a primary concern. Different methods have been evaluated, with the main result mitigation Single Event Effects causing bit-flips in system memory utilizing Bose-Chaudhuri-Hocquenghem (BCH) codes. The general implementation is...

2012
D. Kerwin A. Wilson Y. Lotfi K. Merkel A. Zanchi

Mixed-signal integrated circuits used in space applications are exposed to solar particles and galactic cosmic rays (GCR). For earth orbit environments, the energy and composition of the particle radiation depends primarily upon the orbital inclination and the orbit altitude. However, due to the solar cycle and its interaction with the GCR, there is also a time dependence to the intensity and e...

Journal: :IEICE Transactions on Information and Systems 2010

Journal: :Microprocessors and Microsystems 2023

This paper provides an experimental study of the single-event upset (SEU) susceptibility against thermal neutron radiation a 28-nm bulk Commercial-Off-The-Shelf (COTS) Xilinx Artix-7 FPGA under different angles incidence. Experimental results indicating SEUs on configuration RAM (CRAM) cells, Flip-Flops (FFs), and Block RAMs (BRAMs) are presented discussed. Shapes multiple events (ranging from ...

2006
Ian A. Troxel

1-As NASA and other agencies continue to undertake ever challenging remote sensing missions, the ability of satellites and space probes to diagnose and autonomously recover from faults will be paramount. In addition, a more pronounced use of radiation-susceptible components in order to reduce cost makes the challenge of ensuring system dependability even more difficult. To meet these and other ...

2013
Thiago Felski Pereira Cesar Albenes Zeferino

The constant reduction in the size of components of integrated circuits, as well as the growing operating frequency, increases the vulnerability to internal and external noise sources. These noises can cause a failure in any component, affecting the functioning of the system as a whole. Future Systems-on-Chip with dozens of cores will be based on Networks-on-Chip (NoCs), and will require networ...

2002
Alderico Rodrigues

A fault tolerant computer system has been conceived to become the standard framework that will be utilized by the future family of Brazilian small satellites for scientific applications. Based on the proposed standard, a computer system with three processing modules was developed for the First Brazilian Scientific Application Microsatellite (SACI-1 Satélite Científico). Each processing module i...

2016
Andrew Holland Ross Burgon Richard Harriss

The Open University, in collaboration with e2v technologies Ltd and XCAM Ltd, have been selected to fly an experimental payload on board the UK Space Agency's UKube-1 pilot Cubesat programme. Cubesat payloads offer a unique opportunity to rapidly build and fly space hardware for minimal cost, providing easy access to the space environment. The proposed payload incorporated new imaging technolog...

2014
Navid Amini

With the continued shrinking of CMOS technologies and smaller device sizes, soft errors have become of major concern. Since these types of errors do not reflect a permanent failure of the device, they are also called transient faults. Transient faults or soft errors are mainly caused by Single Event Upsets (SEUs). SEU is a bit-flip in digital systems due to the impact of energy particles [17]. ...

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