نتایج جستجو برای: afm technique

تعداد نتایج: 621308  

2006
Q. Li K.-S. Kim A. Rydberg

A novel diamagnetic lateral force calibrator D-LFC has been developed to directly calibrate atomic force microscope AFM cantilever-tip or -bead assemblies. This enables an AFM to accurately measure the lateral forces encountered in friction or biomechanical-testing experiments at a small length scale. In the process of development, deformation characteristics of the AFM cantilever assemblies un...

2011
Lado Filipovic Siegfried Selberherr

Atomic Force Microscopy (AFM), a lithographic technique capable of manufacturing nanometer-sized devices, is a promising alternative to modern lithographic methods. Performing physical simulations to replicate the AFM process is not feasible for large surface simulations, therefore a Monte Carlo approach must be considered. Previous research showed that the physical shape of an oxide dot or wir...

پایان نامه :دانشگاه بین المللی امام خمینی (ره) - قزوین - دانشکده علوم پایه 1391

در این پژوهش نانوسیم های اکسید روی به روش تبخیر حرارتی پودر zn ، بر روی زیرلایه های شیشه، کوارتز، سیلیکون و فولاد ، تحت شارش گاز آرگون به عنوان گاز حامل و هوا به عنوان گاز واکنش دهنده در دمای 620 درجه سانتیگراد به طور موفقیت آمیزی رشد داده شدند. نمونه های بدست آمده توسط پراش پرتوی ایکس و میکروسکوپ الکترونی روبشی مورد آنالیز قرار گرفتند. برای بررسی تأثیر کاتالیست بر روی رشد نانوسیم ها، زیرلایه ه...

Journal: :international journal of industrial mathematics 2015
h. kangarlou

zns/glass thinlayer in high vacuum condition and $40$ degree‎ ‎deposition angle has been produced by resistance evaporated method ‎with $28$ nm thickness‎. ‎cabin deposition temperature zns layer was‎ ‎about $50c$ and substrates were kept at room temperature‎. ‎the atomic ‎force microscopy (afm) and xrd analyses are perfectly accomplished‎ ‎for this layer.‎‎‎

Journal: :Postepy higieny i medycyny doswiadczalnej 2015
Małgorzata Tokarska-Rodak Maria Kozioł-Montewka Krzysztof Skrzypiec Tomasz Chmielewski Ewaryst Mendyk Stanisława Tylewska-Wierzbanowska

BACKGROUND Atomic force microscopy (AFM) is an experimental technique which recently has been used in biology, microbiology, and medicine to investigate the topography of surfaces and in the evaluation of mechanical properties of cells. The aim of this study was to evaluate the influence of the complement system and specific anti-Borrelia antibodies in in vitro conditions on the modification of...

2010
Thomas Schmid Aleksandar Sebesta Johannes Stadler Lothar Opilik Roman M. Balabin Renato Zenobi

Biological materials can be highly heterogeneous at the nanometer scale. The investigation of nanostructures is often hampered by the low spatial resolution (e.g. spectroscopic techniques) or very little chemical information (e.g. atomic force microscopy (AFM), scanning tunneling microscopy (STM)) provided by analytical techniques. Our research focuses on combined instruments, which allow the a...

2000
P. Vettiger M. Despont U. Drechsler U. Dürig W. Häberle M. I. Lutwyche H. E. Rothuizen R. Stutz R. Widmer G. K. Binnig

We report on a new atomic force microscope (AFM)-based data storage concept called the “Millipede” that has a potentially ultrahigh density, terabit capacity, small form factor, and high data rate. Its potential for ultrahigh storage density has been demonstrated by a new thermomechanical local-probe technique to store and read back data in very thin polymer films. With this new technique, 30–4...

Journal: :Journal of Nanobiotechnology 2004
Jason WM Lee Mah-Lee Ng

BACKGROUND: Microscopic imaging of viruses and their interactions with and effects on host cells are frequently held back by limitations of the microscope's resolution or the invasive nature of the sample preparation procedures. It is also difficult to have a technique that would allow simultaneous imaging of both surface and sub-surface on the same cell. This has hampered endeavours to elucida...

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