نتایج جستجو برای: semiconductor process modelling
تعداد نتایج: 1498214 فیلتر نتایج به سال:
Despite their potential use as pixel-switching elements in displays, the bias and light instability of mixed oxide semiconductor thin-film transistors (TFTs) still limit their application to commercial products. Lack of reproducible results due to the sensitivity of the mixed oxides to air exposure and chemical contamination during or after fabrication hinders any progress towards the achieveme...
Quantum Dots are semiconductor heterostructures, in which the free carriers are confined to a small region by potential barriers in all three directions of space (3D). If the size of the region is less than the electron wavelength, the electronic states become quantized at discrete energy levels as it happens in an atom. Applications: micro and optoelectronic devices, modelling systems at the a...
A drift-diiusion model with density-dependent diiusion coee-cients for the ow of electrons and holes in a semiconductor crystal is considered. It contains a new class of models for recombination-generation eeects as well as boundary conditions modelling Ohmic contacts. Existence of steady state solutions is proven. For a planar pn-diode the qualitative properties of steady state solutions in de...
Characterization and modeling of metal-semiconductor-metal (MSM) GaAs diodes using to evaporate SiO₂ and Pd simultaneously as a mixture electrode (called M-MSM diodes) compared with similar to evaporate Pd as the electrode (called Pd-MSM diodes) were reported. The barrier height (φ(b)) and the Richardson constant (A*) were carried out for the thermionic-emission process to describe well the cur...
The process of thermal Marangoni drying is considered, which has been recently proposed for use in semiconductor production. The process allows ultraclean drying of semiconductor wafer surfaces at the end of a sequence of wet operations. A theoretical model is presented, which incorporates the movement of a thin liquid film on the semiconductor surface, heat exchange between the semiconductor a...
As a common approach in the development of control charts Statistical Process Control (SPC), an industrial process is monitored with one or more quality characteristics using their corresponding distributions. Note though, modelling through relation between some independent and dependent variables alternative which designated as profiles monitoring. This study proposes integration adaptive to c...
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