This study demonstrates the advantages of the combination between atomic force microscopy and scanning electrochemical microscopy. The combined technique can perform nano-electrochemical measurements onto agarose surface and nano-electrografting of non-conducting polymers onto conducting surfaces. This work was achieved by manufacturing an original Atomic Force Microscopy-Scanning ElectroChemic...

The atomic force microscope (AFM) has found wide applicability as a nanoindentation tool to measure local elastic properties of soft materials. An automated approach to the processing of AFM indentation data, namely, the extraction of Young's modulus, is essential to realizing the high-throughput potential of the instrument as an elasticity probe for typical soft materials that exhibit inhomoge...

Tip-enhanced Raman mapping is a powerful, emerging technique that offers rich chemical information and high spatial resolution. Currently, most of the successes in tip-enhanced Raman scattering (TERS) measurements are based on the inverted configuration where tips and laser are approaching the sample from opposite sides. This results in the limitation of measurement for transparent samples only...

Kelvin probe force microscopy (KPFM) is a widely used technique to measure the local contact potential difference (CPD) between an AFM probe and the sample surface via the electrostatic force. The spatial resolution of KPFM is intrinsically limited by the long range of the electrostatic interaction, which includes contributions from the macroscopic cantilever and the conical tip. Here, we prese...

AISI 316 stainless steels were coated with 250 nm Ni film by electron beam deposition and post-annealed at different temperatures with a nitrogen flow of 600 cm3min-1 nitrogen. The prepared samples were corrosion tested in 1.0 M sulphuric acid solution using potentiodynamic technique. Crystallographic and morphological structure of the samples were analyzedanalysed by X-ray diffraction (XRD) an...

Fluid force microscopy combines the positional accuracy and force sensitivity of an atomic force microscope (AFM) with nanofluidics via a microchanneled cantilever. However, adequate loading and cleaning procedures for such AFM micropipettes are required for various application situations. Here, a new frontloading procedure is described for an AFM micropipette functioning as a force- and pressu...

Twenty-seven accessions of Lippia alba Mill. collected in Rio Grande do Sul state, Brazil, were analysed by ISSR and RAPD markers to evaluate their genetic variability and relationships. Six ISSR primers and four RAPD primers generated 120 amplified fragments, most of which were polymorphics. The overall genetic variability among accessions was very high when compared with other plant species. ...

In this paper, we provide a systematic review of atomic force microscopy (AFM), fast-developing technique that embraces scanners, controllers, and cantilevers. The main objectives are to analyze the available technical solutions AFM, including limitations problems. questions addresses problems working in contact, noncontact, tapping AFM modes. We do not include applications but rather design di...

Since the invention of atomic force microscopy (AFM), researchers have been able to study statistical mechanical properties individual polymer chains by using a technique known as single molecule spectroscopy (SMFS), which stretches chain attaching one end substrate and other AFM tip. SMFS is used obtain static information about chains, mainly through quasistatic stretching process. With techno...