the resonant frequency and sensitivity of an atomic force microscope (afm) cantilever with assembled cantilever probe (acp) have been analyzed and a closed-form expression for the sensitivity of vibration modes has been obtained. the proposed acp comprises an inclined cantilever and extension, and a tip located at the free end of the extension, which makes the afm capable of topography at sidew...

We study the non-contact friction between an atomic force microscope tip and a metal substrate in the presence of bias voltage. The friction is due to energy losses in the sample created by the electromagnetic field from the oscillating charges induced on the tip surface by the bias voltage. We show that the friction can be enhanced by many orders of magnitude if the adsorbate layer can support...