نتایج جستجو برای: scanning electron microscope

تعداد نتایج: 431395  

Journal: :Microscopica acta 1978
C Cremer T Cremer

In conventional light microscopy, the depth of focus is severely limited. This limitation might be overcome by a light optical scanning procedure. In this procedure, the specimen surface is scanned point for point by a focused laser beam. The image of the specimen surface is generated by an electronic system, similar to the procedure used in the scanning electron microscope. Possibilities to de...

Journal: :Journal of the Mineralogical Society of Japan 1973

Journal: :Transactions of Japan Society of Spring Engineers 1970

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