نتایج جستجو برای: scanning electron microscope
تعداد نتایج: 431395 فیلتر نتایج به سال:
Journal:
:Microscopica acta
1978
C Cremer
T Cremer
In conventional light microscopy, the depth of focus is severely limited. This limitation might be overcome by a light optical scanning procedure. In this procedure, the specimen surface is scanned point for point by a focused laser beam. The image of the specimen surface is generated by an electronic system, similar to the procedure used in the scanning electron microscope. Possibilities to de...
Journal:
:Journal of Microscopy
2017
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Journal:
:Seibutsu Butsuri
2005
Journal:
:Archivum histologicum japonicum
1974
Journal:
:Microscopy Today
1994
Journal:
:Journal of the Mineralogical Society of Japan
1973
Journal:
:Laser and Particle Beams
2019
Journal:
:Microscopy and Microanalysis
2002
Journal:
:Transactions of Japan Society of Spring Engineers
1970
Journal:
:Journal of Physics: Conference Series
2015
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