نتایج جستجو برای: ingaas

تعداد نتایج: 2410  

2016
Min Ren Scott Maddox Yaojia Chen Madison Woodson Joe C. Campbell Seth Bank

Articles you may be interested in Low-noise AlInAsSb avalanche photodiode Appl. Enhanced frequency response associated with negative photoconductance in an InGaAs/InAlAs avalanche photodetector Appl.

  Band offsets at semiconductor heterojunctions have been shown to be critically dependent on a number of factors. By applying the ab-initio pseudopotential method to the strained InGaAs/GaAs superlattice, we have been able to determine the dependence of the offsets on the strain in the system and on the indium composition. In addition, we have shown that it is possible to control the interface...

Journal: :Applied Physics Letters 2021

The III–V InP/InGaAsP/InGaAs material family is important for photonic devices due to its optical emission and absorption in the 1.55 1.3 μm telecommunication bands interconnects. However, InGaAsP/InGaAs generally suffer from relatively high surface recombination velocity—compared Si [Das et al., 2020 47th IEEE Photovoltaic Specialists Conference (PVSC) (IEEE, Calgary, AB, 2020), pp. 1167–1170]...

Journal: :Crystals 2023

The shortening of the minority carrier lifetime is main reason for degradation electrical performance solar cells; therefore, it particularly important to evaluate inverted metamorphic triple junction (IMM3J) GaInP/GaAs/InGaAs cells. We each subcell IMM3J cells before and after 2 MeV proton irradiation by electroluminescence (EL) method. Before irradiation, lifetimes GaInP, GaAs, InGaAs subcell...

Journal: :Fizika i tehnika poluprovodnikov 2023

The results of studying the optical properties InGaAs quantum dots are presented. Single-layer with a height 5.3, 3.6 and 2.6 monolayers, as well three-stacked layers tunnel-uncoupled monolayers were formed by molecular-beam epitaxy according to Stransky--Krastanov mechanism on GaAs substrates, using partial capping annealing technique. A decrease in size makes it possible carry out blueshift p...

Journal: :Measurement Science and Technology 2019

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