Interaction of silica and silicon nitride with polyurethane surfaces is rather poorly studied despite being of great interest for modern semiconductor industry, e.g., for chemical-mechanical planarization (CMP) processes. Here we show the results from the application of the atomic force microscopy (AFM) technique to study the forces between silica or silicon nitride (AFM tips) and polyurethane ...

The atomic force microscopy (AFM) is a technique that has extensively been used to reveal details on surfaces using different scanning techniques. The human blood components, Human Serum Albumin (HSA) being one of them, as opposed to hard condensed matter samples, are soft and do not adhere well to surfaces, therefore imaging and analyzing soft condensed matter samples using AFM requires certai...

The combination of ultrasound with atomic force microscopy (AFM) opens the high lateral resolution of scanning probe techniques to ultrasonics. Atomic force acoustic microscopy (AFAM) and lateral atomic force acoustic microscopy are techniques which use the vibration modes of AFM cantilevers. In the AFAM-mode the cantilever is vibrating in one of its flexural resonances while the sensor tip is ...

Atomic force microscopy (AFM) is capable of solid surface characterization at the microscopic and submicroscopic scales. It can also be used for the determination of surface tension of solids (gamma) from pull-off force (F) measurements, followed by analysis of the measured F values using contact mechanics theoretical models. Although a majority of the literature gamma results was obtained usin...

High-Resolution Imaging and Manipulation of Membrane Proteins by atomic force microscopy (AFM). Summary Membrane proteins are nanometric machines fulfilling defined functions in cell membranes. They work as transporters, linkers, adhesion molecules, channels, pumps, receptors, enzymes, and in the bio-energetic machineries, only naming a few tasks. In agreement with their importance, it was foun...

In tapping mode atomic force microscopy (AFM), a sharp probe tip attached to an oscillating cantilever is allowed to intermittently strike a surface. By raster scanning the probe while monitoring the oscillation amplitude of the cantilever via a feedback loop, topographical maps of surfaces with nanoscale resolution can be acquired. While numerous studies have employed numerical simulations to ...

Atomic force microscope (AFM) based local anodic oxidation of metallic and semiconducting layers has emerged as a powerful tool for nanoscale fabrication. A unique nanoscale patterning technique has been created that couples computer aided design (CAD) with the lithographic capabilities of the AFM. Target nanostructures to be deposited on a silicon substrate are rendered as a three-dimensional ...

Atomic Force Microscopy (AFM) indentation on living cells in physiological medium is a well established technique used for investigation of the cell mechanical properties at nanoscale. However, interpretation of the experimental data obtained in such experiments is rarely a trivial task. This is happening because living cells have a complex response to the applied mechanical stress, response th...

An experiment to study the effect of inter and intra row spacing on the yielding performance of periwinkle species was conducted at Nagarjun Medicinal and Aromatic Plants Research Scheme, P. K. V., Akola (M. S.) during 1980 - 81 to 82 - 83. Three species viz., Catharanthus roseus, Catharanthus alba and Catharanthus oscillatus did not differ significantly in respect of dried foliage and root yie...

We describe a novel and simple operation method of using a self-sensitive cantilever of an atomic force microscopy (AFM) system in liquid. As for operation of the cantilever in liquid, Al lines of an integrated piezoresistor patterned on the cantilever are easily damaged by electrochemical corrosion. To realize safe operation without the damage, an additional electrode was inserted into the liq...