We performed continuous observations of single-event upset (SEU) cross sections for the energy range 10 meV–1 MeV at Japan Proton Accelerator Research Complex (J-PARC). As a result, we were able to clearly observe effect on Section $^{10}\text{B}$ </in...

Abstract The single event effect caused by space heavy ion radiation is one of the important factors affecting safety and operation spacecraft on orbit. In research evaluation frequency, spatial distribution time characteristics effects, linear energy transfer (LET) spectra play an role. On Beidou navigation M15 M16 satellites, a upset (SEU) LET monitor was developed to obtain upsets memory dev...

The XQR18V04 was evaluated for single event upset rates using proton and heavy ions. The PROM was demonstrated to be immune to latch-up, as well as to static upset in the flash memory cells, to an LET > 125 MeV/mg/cmz (effective). The PROM was also tested in a dynamic mode, which revealed three distinct error modes: Read Bit Errors, Address Errors, and a Single Event Functional Interrupt (SEW w...

Soft errors due to cosmic particles are a growing reliability threat to information systems. In this work, a methodology is developed to analyze the effects of single event upsets (SEU) and obtain Failure In Time (FIT) rates for commercial server microprocessors in live information systems. Our methodology is based on data collected from error logs and error traces of the microprocessors collec...

As a consequence of technology scaling down, gate capacitances and stored charge in sensitive nodes are decreasing rapidly, which makes CMOS circuits more vulnerable to radiation induced soft errors. In this paper, a low cost and highly reliable radiation hardened latch is proposed using 65 nm CMOS commercial technology. The proposed latch can fully tolerate the single event upset (SEU) when pa...

The GRACE – Follow On (GRACE-FO) satellite mission (2018-now) hosts the novel Laser Ranging Interferometer (LRI), a technology demonstrator for proving feasibility of laser interferometry inter-satellite ranging measurements. GRACE-FO extends valuable climate data record changing mass distribution in system Earth, which was started by original (2002-2017). can be deduced from observing changes ...

In this paper, a Soft Error Hardened D-latch with improved performance is proposed, also featuring Single Event Upset (SEU) and Transient (SET) immunity. This novel can tolerate particles as charge injection in different internal nodes, well the input output nodes. The of new circuit has been assessed through key parameters, such power consumption, delay, Power-Delay Product (PDP) at various fr...

Latches based on the Dual Interlocked storage Cell or DICE are very tolerant to Single Event Upsets (SEU). However, for highly scaled processes where the sizes continue to decrease, the data in this latch can be corrupted by an SEU due to charge sharing between adjacent nodes. Some layout considerations are used to improve the tolerance of the DICE latches to SEU and especially the influence of...

This paper investigates the behavior of a SEU tolerant 8051-like micro-controller protected by single error correction Hamming Code in the presence of multiple upsets. Single event upsets (SEUs) and multiple bit upsets (MBUs) were analyzed, since they are more likely to occur in nano-metric technologies under high-energy heavy-ions. Upsets were randomly injected in all sensitive parts of the de...

IC technologies are approaching the ultimate limits of silicon in terms of device size, power supply levels and speed. By approaching these limits, they become increasingly sensitive to noise which result on unacceptable rates of soft-errors. Furthermore, defect behavior becomes increasingly complex, resulting on increasing numbers of timing and other spurious faults that can escape detection d...