In this work, we analyse passivated emitter and rear cells (PERC), based on wafers made from seed manipulation for artificially controlled defects technique (SMART) monocrystalline silicon, magnetically grown conventional Czochralski (mCz Cz) high-performance multicrystalline (hpm) silicon. All were processed identically except the hpm wafers, which received an acidic texture instead of random ...
