Investigation of the mechanical properties of various yttria stabilized zirconia based thin films prepared by aqueous tape casting

Synthesis of Highly Porous Yttria-Stabilized Zirconia by Tape-Casting Methods

Porous ceramics of Y2O3-stabilized ZrO2 (YSZ) were prepared by tape-casting methods using both pyrolyzable pore formers and NiO followed by acid leaching. The porosity of YSZ wafers increased in a regular manner with the mass of graphite or polymethyl methacrylate (PMMA) to between 60% and 75% porosity. SEM indicated that the shape of the pores in the final ceramic was related to the shape of t...

Effect of ion implantation doping on electrical properties of yttria-stabilized zirconia thin films

The change in conductivity of Fe and Ti implanted if-sputtered layers of yttria-stabilized zirconia (YSZ) was studied as a function of the temperature (400-800 °C) and oxygen partial pressure. In an oxidized state and in the temperature range of 400600 ° C, the conductivity of the Fe implanted YSZ film ( 15 keV, 8 × 10 '6 at.cm 2) was dominated by the n-type electronic conductivity of a thin Fe...

Precursor Decomposition, Microstructure, and Porosity of Yttria Stabilized Zirconia Thin Films Prepared by AerosolAssisted Chemical Vapor Deposition

Microstructures of yttria stabilized zirconia thin fi lms deposited by aerosol assisted chemical vapor deposition (AA-CVD) are correlated with the thermal decomposition behavior of the corresponding metal precursors, zirconium and yttrium 2,4-pentanedionate. Process conditions of AA-CVD are investigated with the aim of producing dense and compact YSZ thin fi lms for applications as gas-tight el...

control of the optical properties of nanoparticles by laser fields

در این پایان نامه، درهمتنیدگی بین یک سیستم نقطه کوانتومی دوگانه(مولکول نقطه کوانتومی) و میدان مورد مطالعه قرار گرفته است. از آنتروپی ون نیومن به عنوان ابزاری برای بررسی درهمتنیدگی بین اتم و میدان استفاده شده و تاثیر پارامترهای مختلف، نظیر تونل زنی(که توسط تغییر ولتاژ ایجاد می شود)، شدت میدان و نسبت دو گسیل خودبخودی بر رفتار درجه درهمتنیدگی سیستم بررسی شده اشت.با تغییر هر یک از این پارامترها، در...

Characterization study of yttria-stabilized zirconia (YSZ) thin films produced by pulsed laser deposition

Crystallization of 8mol% yttria-stabilized zirconia thin-films deposited by RF-sputtering

a Laboratory for Development and Methods, Paul Scherrer Institut, 5232 Villigen-PSI, Switzerland b General Energy Research Department, Paul Scherrer Institut, 5232 Villigen-PSI, Switzerland c Massachusetts Institute of Technology (MIT), Department of Materials Science and Engineering and Department of Nuclear Science and Engineering, 77 Massachusetts Ave, Cambridge, MA 02139, USA d Electron Mic...