Detection of TEM, SHV and CTX-M Antibiotic Resistance Genes in Escherichia coli Isolates from Infected Wounds

ABSTRACT &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp; Background and Objective: Escherichia coli is one of the most common causes of hospital-acquired infections. Extended-spectrum &beta;-lactamase (ESBL)-producing E. coli strains are resistant to third-generation cephalosporins. The three main genes involved in ESBL production are TEM, SHV and CTX-M. Detection of ESBL-producing E. coli is of importance for infection control, reduction of excessive antibiotic use and epidemiological surveillance. This study aimed to detect ESBL-producing E. coli strains isolated from wound infections using phenotypic and molecular methods. &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp; Methods: During 2013- early 2015, 86 strains were collected from three hospitals in Isfahan, Iran. Antibiotic susceptibility testing was done using ceftazidime and ceftazidime + clavulanic acid discs. Polymerase chain reaction was used for the detection of the three resistance genes. &nbsp;&nbsp;&nbsp;&nbsp;&nbsp; Results: The resistance genes SHV, CTX-M and TEM were detected in 49 isolates (56.9%). In addition, 39 isolates (45%) were ESBL-producing strains. According to the results, 5 (5.8%), 14 (16.2%), 19 (22%) and 11 (12.7%) isolates contained the SHV, CTX-M, TEM and CTX-M + TEM genes, respectively. The frequency of CTX and TEM were significantly higher than that of SHV gene (P <0.05). Most of the isolated bacteria were resistant to cefazolin and sensitive to nitrofurantoin. &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp; Conclusions: There is a difference between the frequency of ESBL-positive isolates reported in the phenotypic and genotypic methods, which could be due to the lower sensitivity of the phenotypic method and impact of environmental factors on the emergence of antibiotic resistance. &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp; Keywords: Antibiotic resistance genes, ESBL, TEM, SHV, CTX-M, Escherichia coli.