An overview of scanning near-field optical microscopy in characterization of nano-materials
نویسندگان
چکیده مقاله:
Scanning Near-Field Optical Microscopy (SNOM) is a member of scanning probe microscopes (SPMs) family which enables nanostructure investigation of the surfaces on a wide range of materials. In fact, SNOM combines the SPM technology to the optical microscopy and in this way provide a powerful tool to study nano-structures with very high spatial resolution. In this paper, a qualified overview of diverse SNOM methods mostly based on aperture and aperture-less is presented.
منابع مشابه
an overview of scanning near-field optical microscopy in characterization of nano-materials
scanning near-field optical microscopy (snom) is a member of scanning probe microscopes (spms) family which enables nanostructure investigation of the surfaces on a wide range of materials. in fact, snom combines the spm technology to the optical microscopy and in this way provide a powerful tool to study nano-structures with very high spatial resolution. in this paper, a qualified overview of ...
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عنوان ژورنال
دوره 5 شماره Issue 3
صفحات 203- 212
تاریخ انتشار 2014-07-01
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