Thermal Annealing Influence over Optical Properties of Thermally Evaporated SnS/CdS Bilayer Thin Films
Authors
Abstract:
Thin films of tin sulfide/cadmium sulfide (SnS/CdS) were prepared bythermal evaporation method at room temperature on a glass substrate and then annealedat different temperature with the aim of optimizing the optical properties of the materialfor use in photovoltaic solar cell devices. The effect of annealing on optical propertiesof SnS/CdS film was studied in the temperature range of 100 to 400 °C with steps of100 °C. The films were characterized by optical absorption spectra. The opticalconstants such as band gap, refractive index (n) and extinction coefficient (k) werecalculated on different annealing temperature and in the wavelength range of 250 nm to750 nm. Analysis of the optical absorption coefficient demonstrated the presence ofdirect optical transition and the corresponding band gap values showed enhancement asdeposition annealing temperature increased. The energy band gap in the range 2.20 eV –3.18 eV has been obtained for a film as-deposited which increases clearly withincreasing annealing temperature. The refractive index and extinction coefficient bothdecrease notably with increasing annealing temperature.
similar resources
Structural, Electrical and Optical Properties of Molybdenum Oxide Thin Films Prepared by Post-annealing of Mo Thin Films
Molybdenum thin films with 50 and 150 nm thicknesses were deposited on silicon substrates, using DC magnetron sputtering system, then post-annealed at different temperatures (200, 325, 450, 575 and 700°C) with flow oxygen at 200 sccm (standard Cubic centimeter per minute). The crystallographic structure of the films was obtained by means of x-ray diffraction (XRD) analysis. An atomic force micr...
full textStructural, Electrical and Optical Properties of Molybdenum Oxide Thin Films Prepared by Post-annealing of Mo Thin Films
Molybdenum thin films with 50 and 150 nm thicknesses were deposited on silicon substrates, using DC magnetron sputtering system, then post-annealed at different temperatures (200, 325, 450, 575 and 700°C) with flow oxygen at 200 sccm (standard Cubic centimeter per minute). The crystallographic structure of the films was obtained by means of x-ray diffraction (XRD) analysis. An atomic force micr...
full textTunable Photoluminescence via Thermally Evaporated ZnS Ultra Thin Films
ZnS thin films have been deposited by thermal evaporation at various deposition rates. By controlling the deposition rate, the position of the maximum in the photoluminescence spectra could be easily tuned from 2.9 to 2.0 eV, which produced a corresponding change in the emission color. The optical and morphological characteristics of the ZnS thin films were measured. The photoluminescence spect...
full textAnnealing Temperature Effects on the Optical Properties of MnO2: Cu Nanostructured Thin Films
In this work, the effect of annealing temperature on the microstructure, morphology, and optical properties of Cu-doped nanostructured MnO2 thin films were studied. The thin films were prepared by sol-gel spin-coating technique on glass substrates and annealed in the air ambient at 300, 350, 400 and 450 °C temperatures. The structural, morphological and optical properties of t...
full textThickness dependence of the dielectric properties of thermally evaporated Sb2Te3 thin films
Sb2Te3 thin films of different thickness (23 350 nm) were prepared by thermal evaporation technique. The thickness dependence of the ac conductivity and dielectric properties of the Sb2Te3 films have been investigated in the frequency range 10 Hz100 kHz and within the temperature range 293373K. Both the dielectric constant ε1 and dielectric loss factor ε2 were found to depend on frequency, temp...
full textInfluence of Co and Fe substitution on optical and structural properties of zinc oxide thin films
Zn0.97TM0.03O (TM = Co, Fe) thin films were deposited onto glass substrates by the sol–gel method and the effects of transition metals substitution on structural and optical properties of ZnO films were investigated. The X-ray diffraction patterns revealed that the films have wurtzite structure. Optical transmittance of the films was recorded in the range of 200 -800 nm wave length and the band...
full textMy Resources
Journal title
volume 4 issue 1
pages 87- 98
publication date 2019-01-01
By following a journal you will be notified via email when a new issue of this journal is published.
Hosted on Doprax cloud platform doprax.com
copyright © 2015-2023