Determination of porous Silicon thermal conductivity using the “Mirage effect” method

Authors

  • F. Alfeel Department of Physics, Science Faculty, Damascus University, Syria.
  • F. Awad Department of Physics, Science Faculty, Damascus University, Syria.
  • F. Qamar Department of Physics, Science Faculty, Damascus University, Syria.
Abstract:

Mirage effect is contactless and non destructive method which has been used a lot to determine thermal properties of different  kind of samples , transverse photothermal deflection PTD in  skimming configuration with ccd camera  and special programs is used to determine thermal conductivity of porous silicon ps  film. Ps samples were prepared by electrochemical etching. Thermal conductivity with porosity changing was measured and the experiments result compared with theoretical results, and they were almost the same.

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Journal title

volume 5  issue Issue 3

pages  267- 272

publication date 2014-07-01

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