Detection of Polymer Brushes developed via Single Crystal Growth

Single crystals consisting various surface morphologies and epitaxial structures were applied to investigate the effect of other phase regions in the vicinity of a given tethered chains-covered area having a certain molecular weight of amorphous brushes. The designed experiments demonstrated that regardless of the type of surface morphology (patterned and especial mixed-brushes, homo and copolymer single-co-crystals or homo-brush single crystals and epitaxial structures), for a phase region covered by a certain type of brushes, the respective characteristics were similar. Detection of participating phases was possible by atomic force microscopy (AFM) on the basis of quality of employed solvent (amyl acetate) in growth systems, interaction of brushes with respective substrate, stiffness, and crystallinity of PEG-formed areas; hence, fabricated surfaces were not in need of any selective solvent to be detected. Moreover, structure of various single crystals was investigated by the help of conjunction thickness.