Extraction and Modeling of the Optoelectronic Characteristics of an Optical Interconnect Link by Direct Measurement of its Electrical Performance

Direct measurements of optical characteristics of a deployed optical interconnect is difficult. We present here a technique that enables the extraction and modeling of some of the channel's optoelectronic characteristics by direct measurement of its end-to-end electrical performance. This technique can greatly facilitate the optimization of optical link transceivers by providing a realistic model of the optical and optoelectronic components utilized in the link.