Material identificiation using dual energy radiographic measurements
نویسندگان
چکیده
Dual Energy techniques allow an estimation of the effective atomic number and electron density through identification of the photoelectric and compton scattering components in the attenuation coefficient. However in the context of material identification, it is substantially more usefull to try and identify the material type and the thickness of the sample under investigation. Several simulation tools have been developed at the “Centre for X-ray Tomography” of the Ghent University (UGCT) which aid in this analysis. The effectiveness of the algorithm to identify the material type and thickness of the sample relies on two main factors. Two measurements need to be done with two setups which have essentially a different effective energy. The more these effective energies differ, the more contrast is obtained between different materials. On the other hand, the noise on the transmission values needs to be minimized. For this reason an optimization criterion is proposed which incorporates both factors.
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