Implicit test generation for behavioral VHDL models
نویسندگان
چکیده
This paper proposes a behavioral-level test pattern generation algorithm for behavioral VHDL descriptions. The proposed approach is based on the comparison between the implicit description of the fault-free behavior and the faulty behavior, obtained through a new behav-ioral fault model. The paper will experimentally show that the test patterns generated at the behavioral level provide a very high stuck-at fault coverage when applied to diierent gate-level implementations of the given VHDL behavioral speciication. Gate-level ATPGs applied on these same circuits obtain lower fault coverage, in particular when considering circuits with hard to detect faults.
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