Reduction of Surface Roughness Induced Spin Relaxation in MOSFETs by Strain

نویسندگان

  • D. Osintsev
  • O. Baumgartner
  • Z. Stanojevic
  • V. Sverdlov
  • S. Selberherr
چکیده

Silicon, the main material of microelectronics, is predominantly composed of nuclei with zero spin and is characterised by weak spin-orbit interaction in the conduction band. This insures long distance spin propagation through the bulk, which in combination with a possibility of injecting spin at room temperature [2] makes fabrication of spin-based switching devices in the near future feasible. However, the experimentally observed enhancement in spin relaxation in electrically gated lateral-channel silicon structures [3] is an obstacle and a deeper understanding of fundamental spin relaxation mechanisms in silicon MOSFETs is urgently needed.

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تاریخ انتشار 2012