Characterization of Deformation Microstructure using Transmission Electron Microscopy: Observation of Cube Slip in γ-TiAl Alloys at Elevated Temperatures

نویسنده

  • Jung B. Singh
چکیده

This article gives a brief description of the use of diffraction contrast transmission electron microscopy for characterizing the deformation microstructure. The capabilities and limitations of different modes of microscopy are also discussed. One of strengths of transmission electron microscopy technique is its capability to identify uncommon deformation system. This is illustrated by the analysis of the cube-slip observed in the deformation microstructure of γ−TiAl alloys at elevated temperatures.

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تاریخ انتشار 2012