Direct measurement of nanoscale sidewall roughness of optical waveguides using an atomic force microscope
نویسندگان
چکیده
An atomic force microscope ~AFM! with an ultrasharp tip was used to directly measure the sidewall profile of InP/InGaAsP waveguide structures etched using an inductively coupled plasma reactive ion etching ~ICP-RIE! in Cl2-based plasma. A special staircase pattern was devised to allow AFM tip to access the etched sidewall of the waveguides in the normal direction. Statistical information such as correlation length and rms roughness of the sidewall profile obtained through three-dimensional imaging by AFM has been presented. rms roughness as low as 3.45 nm was measured on the sidewall of 4-mm-deep etched InP/InGaAsP heterostructures. © 2003 American Institute of Physics. @DOI: 10.1063/1.1627480#
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