Schottky contacts on passivated GaAs(1 0 0) surfaces: barrier height and reactivity

نویسندگان

  • T. Kampen
  • A. Schüller
  • D.R.T. Zahn
  • Blanca Biel
  • José Ortega
  • Rubén Pérez
  • Fernando Flores
چکیده

We present results on the experimental and theoretical investigations of metal contacts on chalcogen passivated GaAs(1 0 0) surfaces. Photoemission spectroscopy investigations show that depending on the metal used for the contact formation the chalcogen passivation reduces the interaction between metals and GaAs(1 0 0). For Sb no chemical reaction at all with the substrate surface is found, while In and Ag react with the topmost chalcogen layer. For Na and Mg, on the other hand, a strong interaction is found. The chalcogenide like layer on top of the GaAs is disrupted and the metals react with the GaAs bulk, resulting in the formation of Na–As and Mg–As compounds. Concerning the barrier heights a general trend is observed, in that the barrier heights are smaller and larger for chalcogen passivated nand p-type doped substrates, respectively, compared to the barrier heights on non-passivated surfaces. This change in barrier height can qualitatively be explained by an interface dipole, induced by the chalcogen passivation. # 2004 Elsevier B.V. All rights reserved.

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

منابع مشابه

Control of As diffusion using ultrathin metal passivating layers at GaAs( 100) surfaces

We have performed low-energy cathodoluminescence spectroscopy (eLS) and synchrotron radiation photoemission (SXPS) measurements of Sb-passivated, clean and ordered molecular-beam epitaxy-grown GaAs( 100) surfaces. SXPS measurements show an effective stabilization of the surface As/Ga atomic ratio under annealing for Sb-passivated surfaces, in contrast to the variations in the surface stoichiome...

متن کامل

Inhomogeneity in barrier height at graphene/Si (GaAs) Schottky junctions.

Graphene (Gr) interfaced with a semiconductor forms a Schottky junction with rectifying properties, however, fluctuations in the Schottky barrier height are often observed. In this work, Schottky junctions are fabricated by transferring chemical vapor deposited monolayer Gr onto n-type Si and GaAs substrates. Temperature dependence of the barrier height and ideality factor are obtained by curre...

متن کامل

Compositional dependence of Schottky barrier heights for Au on chemically etched lnx Ga1_x P surfaces

Measurements of the Au Schottky barrier height were carried out on thin films of n -In, Ga 1 , P, of various compositions epitaxially grown on n-GaAs substrates. Conventional C-V, I-V, and photo response techniques were used. The junction was formed by evaporating Au in an ionpumped vacuum system onto a Inx Ga1 x P surface which had been chemically etched (5H2S04:1H20 2:1H20 at 40cC for 90s). B...

متن کامل

Gate Metallization Study for InGaP/InGaAs/GaAs pHEMTs

The results of a gate metallization study for InGaP/InGaAs/GaAs pHEMTs are reported. Schottky contacts with Mo/Au, Ti/Au, and Pt/Au metallizations on InGaP lattice matched to GaAs are fabricated and barrier heights of 0.603, 0.621, and 0.738 eV are obtained for Mo/Au, Ti/Au, and Pt/Au contacts, respectively. The electrical properties of 0.7 μm gate length pHEMTs fabricated with each of these me...

متن کامل

Chalcogen passivation of GaAs(1 0 0) surfaces: theoretical study

In this work, structural and electronic properties of Seand S-passivated GaAs(1 0 0) surface reconstructions are investigated by density functional theory (DFT) based methods. We have performed total energy minimization of several model geometries of the reconstructed surfaces at different stoichiometry. The common feature is the appearance of a chalcogen layer on top of the Ga terminated surfa...

متن کامل

ذخیره در منابع من


  با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

عنوان ژورنال:

دوره   شماره 

صفحات  -

تاریخ انتشار 2004