On-Chip ESD Protection Design for Ics

نویسندگان

  • H. G. Feng
  • K. Gong
  • R. Y. Zhan
  • Albert Z. Wang
چکیده

This tutorial paper reviews the state of knowledge of on-chip ESD (electrostatic discharging) protection circuit design for integrated circuits. The discussion covers critical issues in ESD design, such as, ESD test models, ESD failure mechanism, ESD protection structures, ESD device modeling, ESD simulation, ESD layout issues, and ESD influences on circuit functionality, etc. This review serves to provide industrial IC designers with a thorough and heady reference in dealing with ESD protection design.

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تاریخ انتشار 2001