Stuck on a channel

Finite-Geometry Low-Density Parity-Check Codes for Channels with Stuck-at Defects

We investigate the use of finite-geometry low-density parity-check (FG-LDPC) codes for channels with stuckat defects. Such a channel is corrupted by a stuck-at defect pattern in addition to the usual channel-induced noise. When the defect pattern is known to the encoder but not to the decoder, the capacity of the channel is the same as if the defect pattern were also revealed to the decoder. Ca...

A concatenation scheme of LDPC codes and source codes for flash memories

Recently, low-density parity-check (LDPC) codes have been applied in flash memories to correct errors. However, as verified in this article, their performance degrades rapidly as the number of stuck cells increases. Thus, this paper presents a concatenation reliability scheme of LDPC codes and source codes, which aims to improve the performance of LDPC codes for flash memories with stuck cells....

Drilling Stuck Pipe Prediction in Iranian Oil Fields: An Artificial Neural Network Approach

Adaptive hybrid mean and median filtering of high-ISO long-exposure sensor noise for digital photography

This paper presents a new methodology for the reduction of sensor noise from images acquired using digital cameras at highInternational Organization for Standardization (ISO) and longexposure settings. The problem lies in the fact that the algorithm must deal with hardware-related noise that affects certain color channels more than others and is thus nonuniform over all color channels. A new ad...

Fault Characterization, Testability Issue and Design for Testability of Complementary Pass Transistor Logic Circuits

Testability analysis of basic and complex logic gates employing complementary pass transistor logic (CPL) under various single stuck faults is investigated. Results show that all stuck-on faults, bridging faults and more than 90% stuck-at faults in the basic CPL gates are only detectable by current monitoring generally known as IDDQ testing. It is also shown that all stuck-open faults in the ba...