Role of oxygen at screw dislocations in GaN.
نویسندگان
چکیده
Here we report the first direct atomic scale experimental observations of oxygen segregation to screw dislocations in GaN using correlated techniques in the scanning transmission electron microscope. The amount of oxygen present in each of the three distinct types of screw dislocation core is found to depend on the evolution and structure of the core, and thus gives rise to a varying concentration of localized states in the band gap. Contrary to previous theoretical predictions, the substitution of oxygen for nitrogen is observed to extend over many monolayers for the open core dislocation.
منابع مشابه
Interaction of Oxygen with Threading Dislocations in GaN
A review is given of the results of first principles calculations used to investigate the structures and electronic properties of screw and edge dislocations in GaN. The atoms at the core of the full core screw dislocation possess heavily strained bonds leading to deep gap states. Removing the first shell of Ga and N atoms gives a screw dislocation with a small open core consisting of f10 10g t...
متن کاملImaging screw dislocations at atomic resolution by aberration-corrected electron optical sectioning
Screw dislocations play an important role in materials' mechanical, electrical and optical properties. However, imaging the atomic displacements in screw dislocations remains challenging. Although advanced electron microscopy techniques have allowed atomic-scale characterization of edge dislocations from the conventional end-on view, for screw dislocations, the atoms are predominantly displaced...
متن کاملSynchrotron radiation x-ray topography of crystallographic defects in GaN
Aalto University, P.O. Box 11000, FI-00076 Aalto www.aalto.fi Author Sakari Sintonen Name of the doctoral dissertation Synchrotron radiation x-ray topography of crystallographic defects in GaN Publisher School of Electrical Engineering Unit Department of Microand Nanosciences Series Aalto University publication series DOCTORAL DISSERTATIONS 187/2014 Field of research Nanotechnology Manuscript s...
متن کاملTheory of Threading Edge and Screw Dislocations in GaN
Device quality wurtzite-GaN (a) can be grown using metalorganic chemical vapor phase deposition (MOCVD) on (0001) sapphire substrates. The large lattice misfit results in dislocation tangles near the interface but isolated threading dislocations, parallel to c, with densities ,109 cm22 and Burgers vectors c, a, and c 1 a persist beyond ,0.5 mm above the interface [1–3] and thus cross the active...
متن کاملGrowth and properties of InGaN nanoscale islands on GaN
Strong photoluminescence and radiative recombination lifetimes longer than 1 ns at room temperature have been observed in GaN/Si/InGaN/GaN structures containing InGaN submicron islands. The flat islands, with a width at their base in the order of 200 nm and a height in the order of 1—2 nm, grow in a spiral mode around dislocations with partial or pure screw character after a passivation of the ...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید
ثبت ناماگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید
ورودعنوان ژورنال:
- Physical review letters
دوره 91 16 شماره
صفحات -
تاریخ انتشار 2003