Controller and Estimator Design for Regulation of Film Thickness, Surface Roughness, and Porosity in a Multiscale Thin Film Growth Process
نویسندگان
چکیده
This work focuses on simultaneous regulation of film thickness, surface roughness, and porosity in a multiscale model of a thin film growth process using the inlet precursor concentration as the manipulated input. Specifically, under the assumption of continuum, a partial differential equation model is first derived to describe the dynamics of the precursor concentration in the gas phase. The thin film growth process is modeled via a microscopic kinetic Monte Carlo simulation model on a triangular lattice with vacancies and overhangs allowed to develop inside the film. Closed-form dynamic models of the thin film surface profile and porosity are developed and used as the basis for the design of model predictive control algorithms to simultaneously regulate film thickness, surface roughness, and porosity. Both state feedback and porosity estimation-based output feedback control algorithms are presented. Simulation results demonstrate the applicability and effectiveness of the proposed modeling and control approach by applying the proposed controllers to the multiscale model of the thin film growth process.
منابع مشابه
Stochastic Modeling and Simultaneous Regulation of Surface Roughness and Porosity in Thin Film Deposition
This work focuses on stochastic modeling and simultaneous regulation of surface roughness and porosity for a porous thin film deposition process modeled via kinetic Monte Carlo (kMC) simulation on a triangular lattice. The microscopic model of the thin film growth process includes adsorption and migration processes. Vacancies and overhangs are allowed inside the film for the purpose of modeling...
متن کاملGrowth, Characterization of Cu Nanoparticles Thin Film by Nd: YAG Laser Pulses Deposition
We report the growth and characterization of Cu nanoparticles thin film of on glass substrate by pulse laser deposition method. The Cu thin film prepared with different energy 50, 60, 70, and 80 mJ. The energy effect on the morphological, structural and optical properties were studied by AFM, XRD and UV-Visible spectrophotometer. Surface topography studied by atomic force microscopy revealed na...
متن کاملDry and Wet Wear Characteristic of TiO2 Thin Film Prepared by Magnetic Sputtering in Ringer Solution
In this research, a thin film of TiO2 was applied on AZ91D using the method of magnetic sputtering. Microstructure investigations were done using field emission scanning electron microscope (FESEM) and X-ray diffraction (XRD). Wear resistance for the coating was investigated using the pin on the disk in the form of dry and in the Ringer's solution. After this test, the worn surface of the sampl...
متن کاملA study on the dependence of DC electrical properties and nanostructure of Cu thin films on film thickness
This paper reports the correlation between film thickness, nanostructure and DC electrical properties of copper thin films deposited by PVD method on glass substrate. X-ray diffraction (XRD) and atomic force microscopy (AFM) were used for crystallography and morphology investigation, respectively. Resistivity was measured by four point probe instrument, while a Hall effects measurement system w...
متن کاملA study on the dependence of DC electrical properties and nanostructure of Cu thin films on film thickness
This paper reports the correlation between film thickness, nanostructure and DC electrical properties of copper thin films deposited by PVD method on glass substrate. X-ray diffraction (XRD) and atomic force microscopy (AFM) were used for crystallography and morphology investigation, respectively. Resistivity was measured by four point probe instrument, while a Hall effects measurement system w...
متن کامل