Curvature effect in grazing X-ray reflectometry
نویسنده
چکیده
Grazing X-ray reflectometry is currently used for the characterization of thin layer
منابع مشابه
Use of Fourier transfoim in grazing X-rays reflectometry
Grazing X-ray reflectometry allows the analysis of thin layer stacks. The fitting of the reflectivity curve by a trial and error method can be used in order to determine the parameters of the films. Fourier analysis of the experimental reflectivity can directly give a rough determination of the profit index. Application to real examples shows the validity of the method.
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We have developed a new type of a thin-film electroluminescence (TFEL) device with nanostructured (NS)-ZnS:Mn utilizing its enhanced luminescent efficiency due to the quantum confinement (QC) effects. As NS-ZnS:Mn, ZnS:Mn/Si3N4 multilayers with thicknesses of 1.9– 3.5 nm for ZnS were prepared by a rf-magnetron sputtering method. From the results of grazing incidence X-ray reflectometry and X-ra...
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