Addressing Test Cost Challenges in LPCT Designs
نویسنده
چکیده
Multi-site testing is a technique where a large number of dies are tested in parallel to increase silicon test throughput. The stimuli is stored on the tester and applied concurrently to all the dies on the test board and compared against the response data. To achieve multi-site testing of 16X, 32X, 64X, or 128X, the number of tester-contacted pins must be very low. The overall tester data and the test time saved by switching to multi-site test are enormous.
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