In-Plane AFM Probe with Tunable stiffness
نویسندگان
چکیده
We developed an in-plane Atomic Force Microscope (AFM) probe that is specifically tailored to the needs of biological applications. It features a variable stiffness, which makes the stiffness of the probe adjustable to the surface hardness of the sample [1]. The inherent capability of the in-plane AFM probe for building a massively parallel array is also an important feature that greatly affects the speed of the AFM scanning process.
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