Application of total reflection X-ray fluorescence spectrometry to small glass fragments.

Total Reflection X-ray Fluorescence Spectrometry for Characterization of Nuclear Materials

Total reflection X-Ray Fluorescence (TXRF) is a comparatively new technique of material characterization and trace element analysis. It is an advanced variant of Energy Dispersive X-ray Fluorescence (EDXRF) and is based on the principle of total reflection of X-rays when these radiations fall on a flat smooth surface at a grazing angle less than the critical angle of the sample support. The cri...

Forensic discrimination of sheet glass by a refractive-index measurement and elemental analysis with synchrotron radiation X-ray fluorescence spectrometry.

Measurements of the refractive index (RI) and elemental analysis using synchrotron radiation X-ray fluorescence spectrometry (SR-XRF) were applied to the forensic discrimination of sheet-glass samples from different origins. The refractive index was calculated from the matching temperature at which the glass fragments became invisible in silicone oil. Fragments smaller than 1 mm in maximum diam...

Determination of carbon in natural freshwater biofilms with total reflection X-ray fluorescence spectrometry

Determining the Content of Silicon Dioxide in Bauxites Using X-Ray Fluorescence Spectrometry

The X-ray fluorescence spectrometry and the MA.BM.006 reference spectrophotometric methods were used to determine the content of SiO2 (%) in bauxites from different deposits. The treatment of samples prior to the analysis involved the following steps: annealing, melting using the borax method,  and the formation of beads. Certified reference bauxite samples were used for the cali...

Synchrotron radiation-induced total reflection X-ray fluorescence analysis

Synchrotron radiation-induced total reflection X-ray fluorescence (SR-TXRF) analysis is a high sensitive analytical technique that offers limits of detection in the femtogram range for most elements. Besides the analytical aspect, SR-TXRF is mainly used in combination with angle-dependent measurements and/or X-ray absorption near-edge structure (XANES) spectroscopy to gain additional informatio...